1 |
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X-ray diffraction analyses of titanium coatings produced by electron beam evaporation in neon and argon inert gases/
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Avelar-Batista, J. C
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Published for the Society by the American Institute of Physics
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2003
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2 |
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X-ray diffraction study of residual stresses and microstructure in tungsten thin films sputter deposited on polyimide/
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Villain, P
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Published for the Society by the American Institute of Physics
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2003
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3 |
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X-ray photoelectron spectroscopic characterization of the adhesion behavior of chemical vapor deposited copper films/
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Kim, Young Suk
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Published for the Society by the American Institute of Physics
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2001
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4 |
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X-ray photoelectron spectroscopy and secondary electron yield analysis of Al and Cu samples exposed to an accelerator environment/
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Rosenberg, R. A
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Published for the Society by the American Institute of Physics
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2003
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5 |
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X-ray photoelectron spectroscopy and static secondary ion mass spectroscopy study of activation mechanism of Zr-V low activation temperature nonevaporable getter films/
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Masek, K
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Published for the Society by the American Institute of Physics
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2003
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6 |
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X-ray photoelectron spectroscopy study of the first stages of ZnO growth and nanostructure dependence of the effects of polarization at ZnO/SiO~2 and ZnO/Al~2O~3 interfaces/
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Martin-Concepcion, A. I
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Published for the Society by the American Institute of Physics
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2003
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7 |
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X-ray photoelectron spectroscopy, x-ray absorption spectroscopy, and x-ray diffraction characterization of CuO-TiO2-CeO2 catalyst system/
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Francisco, M S P
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Published for the Society by the American Institute of Physics
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2001
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8 |
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X-ray photoemission spectra and x-ray excited Auger spectrum investigation of the electronic structure of Pd~3(PS~4)~2/
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Grasso, V
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Published for the Society by the American Institute of Physics
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2003
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