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1 저널기사 High-resolution grazing-incidence x-ray diffraction for characterizationof defects in crystal surface layers 미리보기
Kondrashkina, E. A American Institute of Physics 1980
2 저널기사 An angle-scanned photoelectron diffraction (XPD) study of the growth andstructure of ultrathin Fe films on Au(001) 미리보기
Opitz, R North-Holland Pub. Co 1980
3 저널기사 Inclined inheritance of interface roughness in semiconductor superlattices as characterized by x-ray reciprocal space mapping (6 pages)/ 미리보기
Schmidbauer, M Published for the American Physical Society by the American Institute of Physics 2001
4 저널기사 Effect of Nickel Purity on Cube Texture Formation in RABiT-Tapes/ 미리보기
Eickemeyer, J North-Holland 2000
5 저널기사 PART 1 - REGULAR ARTICLES - Liquid crystals - Structure of freely suspended chiral smectic films as determined by x-ray reflectivity and optical ellipsometry (8 pages)/ 미리보기
Fera, A Published by the American Physical Society through the American Institute of Physics 2001
6 저널기사 PART 1 - RAPID COMMUNICATIONS - Films, interfaces, and crystal growth - Crystalline smectic-B films as fluctuating systems: Static and dynamic x-ray scattering (4 pages)/ 미리보기
Fera, Andrea Published by the American Physical Society through the American Institute of Physics 2001
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