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PART I - Exchange Bias and Heads - Magnetic Properties and Reliabilities of FeXN (X = Ti, Al, Hf, CoHf, CrHf) Nanocrystalline Thin Film Head Materials/ / Kim, K H / Published by the Institute of Electrical and Electronics Engineers for the Magnetics Group / IEEE transactions on magnetics. / 2656-2659p. / 2000
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