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저널기사
PART I - Spin-Dependent Transport, Tunnel Junctions, MRAM, and Related Sensors - Electrostatic Discharge Testing of Tunneling Magnetoresistive (TMR) Devices/ / Wallash, A / Published by the Institute of Electrical and Electronics Engineers for the Magnetics Group / IEEE transactions on magnetics. / 2809-2811p. / 2000
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