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PART I - Magnetic Measurements, Sensors, and Instrumentation - Study of In-Depth Defects Using Magneto-Optical Kerr Effect by Measuring the Magnetic Hardness Coefficient in Magnetic Thin Films/ / Leong, S H / Published by the Institute of Electrical and Electronics Engineers for the Magnetics Group / IEEE transactions on magnetics. / 3611-3613p. / 2000
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