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Electrical characterization of shallow cobalt-silicided junctions/ / Garbar, N; Katcki, J; Ratajczak, J; Petrichuk, M; Claeys, C; Gaubas, E Simoen, E Poyai, A; Lukyanchikova, N; Czerwinski, A; / Chapman and Hall / Journal of materials science Materials i / p.207-210 / 2001

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