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Radiation damage of N-MOSFETS fabricated in a BiCMOS process/ / Nakabayashi, M; Yoneoka, M; Simoen, E; Claeys, C; Ohyama, H; Takizawa, H; Kobayashi, K Hayama, K; Takami, Y; Kohiki, S / Chapman and Hall / Journal of materials science Materials i / p.227-230 / 2001
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