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C -V, DLTS and conductance transient characterization of \hbox{SiN}{x}\,{\bf:}\,\hbox{H/InP} interface improved by \hbox{N}{2} remote plasma cleaning of the InP surface/ / Barbolla, J; Cast�n, H M�rtil, I; Due�s, S; Redondo, E; Gonz�lez-D�z, G / Chapman and Hall / Journal of materials science Materials i / p.263-268 / 2001
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