충남대학교외국학술지지원센터

글로벌메뉴

  • HOME
  • sitemap

주메뉴


임시보관함

  • |Home >
  • 임시보관함

검색간략리스트

1.
저널기사
Characterization of the electrical properties and thickness of thin epitaxial semiconductor layers by THz reflection spectroscopy/ / Hashimshony, D / American Institute of Physics / Journal of applied physics / 5778-5781p. / 2001

하단메뉴