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검색간략리스트

1.
저널기사
An improved analysis for the determination of trap levels in silicon from laser microwave photoconductive decay measurements / Ling, C. H / American Institute of Physics / APPLIED PHYSICS LETTERS / 3218 / 1980
2.
저널기사
An Empirical Analysis of the Impact of Uncertainty Qualifications on the Market Risk Components / Wayne Alderman, C. / Institute of Chartered Accountants / Accounting and business research / 258-266 / 1979

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