충남대학교외국학술지지원센터

글로벌메뉴

  • HOME
  • sitemap

주메뉴


저장/메일/인쇄

  • |Home >
  • 저장/메일/인쇄

검색간략리스트

저널기사
Scanning reflection electron microscopy study of surface defects in GaN films formed by epitaxial lateral overgrowth/ / Watanabe, Heiji / American Institute of Physics / Applied physics letters / 1786-1788p. / 2000
항목 :
이메일 : 제목 :

하단메뉴