181 |
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In situ transmission electron microscopy study of Ni silicide phases formed on (001) Si active lines/
|
Teodorescu, V
|
American Institute of Physics
|
2001
|
|
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182 |
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Magnetic entropy change in La0.54Ca0.32MnO3-d/
|
Xu, Q Y
|
American Institute of Physics
|
2001
|
|
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183 |
|
Polarization-resolved linewidth-power product of a vertical-cavity semiconductor laser/
|
Willemsen, M B
|
American Institute of Physics
|
2001
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|
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184 |
|
Erratum: "Stress calculation in atomistic simulations of perfect and imperfect solids" (J. Appl. Phys. 89, 99 (2001))/
|
Cormier, J
|
American Institute of Physics
|
2001
|
|
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185 |
|
Effects of ultraviolet and thermal pretreatment on the formation of self-written x(2) gratings and optical damage/
|
Blazkiewicz, Paul
|
American Institute of Physics
|
2001
|
|
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186 |
|
Electrostatic probe diagnostics of a planar-type radio-frequency inductively coupled oxygen plasma/
|
Seo, D C
|
American Institute of Physics
|
2001
|
|
|
187 |
|
High-transmittance surface textures formed by plasma etching of metallophthalocyanine films/
|
Sakata, Hajime
|
American Institute of Physics
|
2001
|
|
|
188 |
|
Temperature dependence of electric-field induced photoluminescence from an InGaN-based light-emitting diode/
|
Kudo, Hiromitsu
|
American Institute of Physics
|
2001
|
|
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189 |
|
Growth of Si0.75Ge0.25 alloy layers grown on Si(001) substrates using step-graded short-period (Sim/Gen)N superlattices/
|
Rahman, M M
|
American Institute of Physics
|
2001
|
|
|
190 |
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Determination of processing damage in thin polycrystalline Ir films using Bragg-peak fringe analysis/
|
Saenger, K L
|
American Institute of Physics
|
2001
|
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