| LDR | | 03039casuu2200637 a 4500 |
| 001 | | 000000180544 |
| 005 | | 20020926183713 |
| 008 | | 751101c19639999nyuqn1p 0 a0eng d |
| 010 | |
▼a 57048223 //r85 |
| 022 | |
▼a 0018-9529 |
| 030 | |
▼a IEERAJ |
| 032 | |
▼a 257020
▼b USPS |
| 035 | |
▼a (OCoLC)1752560 |
| 035 | |
▼a 000057048223 |
| 040 | |
▼a MnMULS
▼c MnMULS
▼d 225009
▼d OCoLC
▼d NSDP
▼d CtY
▼d InU
▼d NSDP
▼d AIP
▼d DLC
▼d m/c
▼d NST |
| 042 | |
▼a nsdp
▼a lc |
| 050 | 00 |
▼a TK7800
▼b .I16 |
| 082 | 00 |
▼a 620.004505
▼2 18 |
| 090 | |
▼a 620.004505
▼b I22
▼c v.12- |
| 210 | 0 |
▼a IEEE trans. reliab. |
| 212 | 0 |
▼a Institute of Electrical and Electronics Engineers transactions on reliability |
| 222 | 0 |
▼a IEEE transactions on reliability |
| 245 | 00 |
▼a IEEE transactions on reliability/
▼c Professional Technical Group on Reliability. |
| 246 | 10 |
▼a Transactions on reliability. |
| 246 | 10 |
▼a Reliability. |
| 260 | |
▼a [New York, N.Y.:
▼b Institute of Electrical and Electronics Engineers,
▼c c1963-. |
| 300 | |
▼a v.:
▼b ill.;
▼c 28 cm. |
| 310 | |
▼a Five no. a year,
▼b <, Oct. 1975-> |
| 321 | |
▼a Irregular,
▼b 1963- |
| 362 | 0 |
▼a Vol. R-12, no. 1 (Mar. 1963)- |
| 500 | |
▼a Title from cover. |
| 510 | 2 |
▼a Mathematical reviews
▼x 0025-5629 |
| 510 | 2 |
▼a Engineering index monthly (1984)
▼x 0742-1974 |
| 510 | 2 |
▼a Engineering index bioengineering abstracts
▼x 0736-6213 |
| 510 | 2 |
▼a Engineering index energy abstracts
▼x 0093-8408 |
| 510 | 1 |
▼a Index to IEEE publications
▼x 0099-1368 |
| 510 | 2 |
▼a Coal abstracts
▼x 0309-4979 |
| 510 | 2 |
▼a Ship abstracts
▼x 0346-1025 |
| 510 | 1 |
▼a Computer & control abstracts
▼x 0036-8113
▼b 1968- |
| 510 | 1 |
▼a Electrical & electronics abstracts
▼x 0036-8105
▼b 1968- |
| 510 | 1 |
▼a Physics abstracts. Science abstracts. Series A
▼x 0036-8091
▼b 1968- |
| 510 | 0 |
▼a Chemical abstracts
▼x 0009-2258 |
| 510 | 2 |
▼a Engineering index annual (1968)
▼x 0360-8557 |
| 510 | 0 |
▼a Engineering index monthly
▼x 0013-7960 |
| 510 | 2 |
▼a International aerospace abstracts
▼x 0020-5842 |
| 510 | 0 |
▼a Nuclear science abstracts
▼x 0029-5612 |
| 550 | |
▼a Vols. for 1963- issued by the Institute of Electrical and Electronics Engineers, Professional Technical Group on Reliability: <Oct. 1975>- by the IEEE Reliability Group; <1979-> by the IEEE Reliability Society. |
| 550 | |
▼a Vol. for <1975-> published also as the journal of the Electronics Division, American Society for Quality Control. |
| 650 | 0 |
▼a Electronic industries
▼x Quality control
▼x Periodicals. |
| 710 | 21 |
▼a Institute of Electrical and Electronics Engineers.
▼b Professional Technical Group on Reliability. |
| 710 | 21 |
▼a IEEE Reliability Group. |
| 710 | 20 |
▼a IEEE Reliabilty Society. |
| 710 | 20 |
▼a American Society for Quality Control.
▼b Electronics Division. |
| 780 | 00 |
▼t IRE transactions on reliability and quality control
▼x 0097-4552
▼w (DLC)sf 84001157
▼w (OCoLC)2015055 |
| 866 | |
▼a v.25(1976), v.26:no.1-3(1977), v.31(1982), v.32:no.1-3(1983), v.33(1984)-v.49(2000) |
| 990 | |
▼b 박춘규 |