| LDR | | 02371casuu2200481 a 4500 |
| 001 | | 000000333902 |
| 005 | | 20050224155013 |
| 008 | | 780331d19701993nyuar1 1 a0eng d |
| 010 | |
▼a 82640313 //r95
▼z 76180194 |
| 022 | 0 |
▼a 0735-0791 |
| 030 | |
▼a ARLPBI |
| 035 | |
▼a (OCoLC)3766693 |
| 040 | |
▼a OTU
▼c OTU
▼d DLC
▼d NSDP
▼d NST
▼d DLC
▼d NST
▼d AIP
▼d NST
▼d OCoLC
▼d InU
▼d NST
▼d OCoLC
▼d NST
▼d OCoLC
▼d NST
▼d MCM
▼d DLC
▼d NSDP
▼d OUCA
▼d 225009 |
| 042 | |
▼a lc
▼a nsdp |
| 050 | 00 |
▼a TK7870
▼b .S95 |
| 082 | 0 |
▼a 621.381
▼2 19 |
| 090 | |
▼a 621.381
▼b I61a
▼c 1970-1993 |
| 111 | 2 |
▼a International Reliability Physics Symposium. |
| 210 | 0 |
▼a Reliab. phys. |
| 222 | 0 |
▼a Reliability physics |
| 245 | 10 |
▼a Reliability physics. |
| 260 | |
▼a New York, N.Y.:
▼b Electron Devices and Reliability Societies of the Institute of Electrical and Electronics Engineers,
▼c [1970]-c1993. |
| 300 | |
▼a v.:
▼b ill.;
▼c 28 cm. |
| 310 | |
▼a Annual |
| 362 | 1 |
▼a Began with vol. for 1970. |
| 362 | 0 |
▼a -31st (March 23-25, 1993). |
| 500 | |
▼a Description based on: 19th (Apr. 7-9, 1981). |
| 504 | |
▼a Includes bibliographical references. |
| 510 | 0 |
▼a Chemical Abstracts
▼x 0009-2258 |
| 510 | 1 |
▼a Index to IEEE publications
▼x 0099-1368 |
| 550 | |
▼a Sponsored by: the IEEE Electron Devices Society and the IEEE Reliability Group, 1970- ; the IEEE Electron Devices Group and the IEEE Reliability Group, <1974-1978>; the IEEE Electron Devices Society and the IEEE Reliability Society, <1981>-1993. |
| 650 | 0 |
▼a Electronic apparatus and appliances
▼x Reliability
▼x Congresses. |
| 650 | 0 |
▼a Electronic apparatus and appliances
▼x Testing
▼x Congresses. |
| 650 | 0 |
▼a Integrated circuits
▼x Reliability
▼x Congresses. |
| 650 | 0 |
▼a Integrated circuits
▼x Testing
▼x Congresses. |
| 710 | 2 |
▼a IEEE Electron Devices Society. |
| 710 | 2 |
▼a IEEE Reliability Group. |
| 710 | 2 |
▼a IEEE Reliability Society. |
| 710 | 2 |
▼a Institute of Electrical and Electronics Engineers.
▼b Electron Devices Group. |
| 780 | 00 |
▼a Reliability Physics Symposium.
▼t Proceedings |
| 785 | 00 |
▼t IEEE international reliability physics proceedings
▼x 1082-7285
▼w (DLC) 95647571
▼w (OCoLC)30847997 |
| 866 | |
▼a 225009
▼b 1975=13th(1975), 1978=16th(1978)-1984=22th(1984), 1986=24th(1986), 1991=29th(1991)-1992=30th(1992) |
| 990 | |
▼b 김상호 |