| 23861 |
|
Transmission electron microscopy analysis of a multiple quantum wire structure fabricated by dislocation slip
|
Ressier, L
|
American Institute of Physics
|
1980
|
|
|
|
| 23862 |
|
Transmission electron microscopy analysis of crystallographic transition from fcc to fct on PtMn spin valves/
|
Maesaka, Akihiro
|
American Institute of Physics
|
2000
|
|
|
|
| 23863 |
|
Transmission electron microscopy and cathodoluminescence of tensile-strained Ga~xIn~1~-~xP/InP heterostructures. II. On the origin of luminescence heterogeneities in tensile stress relaxed Ga~xIn~1~-~xP/InP heterostructures
|
Cleton, F
|
American Institute of Physics
|
1980
|
|
|
|
| 23864 |
|
Transmission electron microscopy and cathodoluminescence of tensile-strained Ga~xIn~1~-~xP/InP heterostructures. I. Spatial variations of the tensile stress relaxation
|
Cleton, F
|
American Institute of Physics
|
1980
|
|
|
|
| 23865 |
|
Transmission electron microscopy and reflected high-energy electron-diffraction investigation of plastic relaxation in doped and undoped ZnSe/GaAs(001)
|
Rosenauer, A
|
American Institute of Physics
|
1980
|
|
|
|
| 23866 |
|
Transmission electron microscopy estimation of Bi-YIG nanoparticle hybridized with plastic material/
|
Kim, T.-Y
|
American Institute of Physics
|
2003
|
|
|
|
| 23867 |
|
Transmission electron microscopy investigation of the high temperature BiScO~3-PbTiO~3piezoelectric ceramic system/
|
Randall, C. A
|
American Institute of Physics
|
2003
|
|
|
|
| 23868 |
|
Transmission electron microscopy investigation of tin sub-oxide nucleation upon SnO~2 deposition on silicon
|
Alfonso, C
|
American Institute of Physics
|
1980
|
|
|
|
| 23869 |
|
Transmission electron microscopy investigations of damage induced by high energy helium implantation in 4H-SiC/
|
Beaufort, M. F
|
American Institute of Physics
|
2003
|
|
|
|
| 23870 |
|
Transmission electron microscopy observation of deformation microstructure under spherical indentation in silicon/
|
Bradby, J E
|
American Institute of Physics
|
2000
|
|
|
|
| 23871 |
|
Transmission electron microscopy observation of lateral order/disorder structures in (Al)GaInP
|
Burkard, M
|
American Institute of Physics
|
1980
|
|
|
|
| 23872 |
|
Transmission electron microscopy observations of ferroelectric domains in the tetragonal Pb(Ni1/3Nb2/3)O3-PbZrO3-PbTiO3 ceramics modified by bismuth and zinc/
|
Zhu, Xinhua
|
American Institute of Physics
|
2001
|
|
|
|
| 23873 |
|
Transmission electron microscopy of <100> dark line defects in CdZnSe quantum well structures
|
U'Ren, G. D
|
American Institute of Physics
|
1980
|
|
|
|
| 23874 |
|
Transmission electron microscopy of as-quenched inert gas atomized particles: Effect of alloying additions in Nd~2Fe~1~4B
|
Wang, J.-Y
|
American Institute of Physics
|
1980
|
|
|
|
| 23875 |
|
Transmission electron microscopy of Terfenol-D crystals
|
Holden, A. P
|
American Institute of Physics
|
1980
|
|
|
|
| 23876 |
|
Transmission electron microscopy on {113} rodlike defects and {111} dislocation loops in silicon-implanted silicon
|
Pan, G. Z
|
American Institute of Physics
|
1980
|
|
|
|
| 23877 |
|
Transmission electron microscopy studies of crystal-to-amorphous transition in ion implanted silicon
|
Ishimaru, M
|
American Institute of Physics
|
1980
|
|
|
|
| 23878 |
|
Transmission electron microscopy study of a defected zone in GaN on a SiC substrate grown by hydride vapor phase epitaxy/
|
Bendersky, L. A
|
American Institute of Physics
|
2003
|
|
|
|
| 23879 |
|
Transmission electron microscopy study of damaged layer on GaAs surface induced by low-energy ion irradiation/
|
Kato, J
|
American Institute of Physics
|
2003
|
|
|
|
| 23880 |
|
Transmission electron microscopy study of interface and internal defect structures of homoepitaxial diamond
|
Tarutani, M
|
American Institute of Physics
|
1980
|
|
|
|
