| 321 |
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PART I - Domains and Magnetization Processes - Magnetic Domain Studies of Permalloy Wire-Based Structures with Junctions/
|
Hirohata, A
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Published by the Institute of Electrical and Electronics Engineers for the Magnetics Group
|
2000
|
|
|
|
| 322 |
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PART I - Domains and Magnetization Processes - Magnetization Properties and Domain Structures of Grain-Oriented Silicon Steel Sheets Due to Bending Stress/
|
Saito, A
|
Published by the Institute of Electrical and Electronics Engineers for the Magnetics Group
|
2000
|
|
|
|
| 323 |
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PART I - Domains and Magnetization Processes - Magnetization Vector Directions in a Steel Cube/
|
Mao, W
|
Published by the Institute of Electrical and Electronics Engineers for the Magnetics Group
|
2000
|
|
|
|
| 324 |
|
PART I - Domains and Magnetization Processes - Magnetoresistance of a Sloe Domain Wall in Co and Ni Nanowires/
|
Radulescu, A
|
Published by the Institute of Electrical and Electronics Engineers for the Magnetics Group
|
2000
|
|
|
|
| 325 |
|
PART I - Domains and Magnetization Processes - Mechanism of Relaxation Dispersions of Permeability Spectra in Co-Based Amorphous Wire/
|
Song, S-H
|
Published by the Institute of Electrical and Electronics Engineers for the Magnetics Group
|
2000
|
|
|
|
| 326 |
|
PART I - Domains and Magnetization Processes - Metastable States in Large Angle Magnetization Rotations/
|
Kabos, P
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Published by the Institute of Electrical and Electronics Engineers for the Magnetics Group
|
2000
|
|
|
|
| 327 |
|
PART I - Domains and Magnetization Processes - Nonlinear Landau-Lifshitz Dynamics for Circularly and Elliptically Polarized Applied Magnetic Fields/
|
Selpico, C
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Published by the Institute of Electrical and Electronics Engineers for the Magnetics Group
|
2000
|
|
|
|
| 328 |
|
PART I - Domains and Magnetization Processes - Observation of Barkhausen Noise in a 20x200 mm Permalloy Thin Film Square Dot/
|
Callegaro, L
|
Published by the Institute of Electrical and Electronics Engineers for the Magnetics Group
|
2000
|
|
|
|
| 329 |
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PART I - Domains and Magnetization Processes - Pulsed-Cuffent-Induced Domain Wall Propagation in Permalloy Patterns Observed Using Magnetic Force Microscope/
|
Gan, L
|
Published by the Institute of Electrical and Electronics Engineers for the Magnetics Group
|
2000
|
|
|
|
| 330 |
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PART I - Domains and Magnetization Processes - Statistical Fluctuations During Magnetization Reversal in Fe Films/
|
Puppin, E
|
Published by the Institute of Electrical and Electronics Engineers for the Magnetics Group
|
2000
|
|
|
|
| 331 |
|
PART I - Domains and Magnetization Processes - Strain-Magnetization Properties and Domain Structure Change of Silicon Steel Sheets Due to Plastic Stress/
|
Notoji, A
|
Published by the Institute of Electrical and Electronics Engineers for the Magnetics Group
|
2000
|
|
|
|
| 332 |
|
PART I - Domains and Magnetization Processes - Time Dependent Magnetics of Exchange Biased Spin Valves/
|
Mao, S
|
Published by the Institute of Electrical and Electronics Engineers for the Magnetics Group
|
2000
|
|
|
|
| 333 |
|
PART I - Domains and Magnetization Processes - Transitional Domain Wall Structure in Permalloy Magnetic Films With Decreasing Thickness/
|
Redjdal, M
|
Published by the Institute of Electrical and Electronics Engineers for the Magnetics Group
|
2000
|
|
|
|
| 334 |
|
PART I - Exchange Bias and Heads - Annealing Effect on Exchange Bias in Ni81Fe19/Cr50Mn50 Bilayers/
|
Xi, H
|
Published by the Institute of Electrical and Electronics Engineers for the Magnetics Group
|
2000
|
|
|
|
| 335 |
|
PART I - Exchange Bias and Heads - A Theoretical Study of Interfacial Spin Flop in Exchange-Coupled Bilayers/
|
Xi, H
|
Published by the Institute of Electrical and Electronics Engineers for the Magnetics Group
|
2000
|
|
|
|
| 336 |
|
PART I - Exchange Bias and Heads - Magnetic Properties and Reliabilities of FeXN (X = Ti, Al, Hf, CoHf, CrHf) Nanocrystalline Thin Film Head Materials/
|
Kim, K H
|
Published by the Institute of Electrical and Electronics Engineers for the Magnetics Group
|
2000
|
|
|
|
| 337 |
|
PART I - Exchange Bias and Heads - Magnetization Reorientation Due to Interface Roughness/
|
Silva, M L
|
Published by the Institute of Electrical and Electronics Engineers for the Magnetics Group
|
2000
|
|
|
|
| 338 |
|
PART I - Exchange Bias and Heads - Modification of the Exchange Bias Effect by the He Ion Irradiation/
|
Mougin, A
|
Published by the Institute of Electrical and Electronics Engineers for the Magnetics Group
|
2000
|
|
|
|
| 339 |
|
PART I - Exchange Bias and Heads - Stabilization Films for Dual Stripe Read Sensors/
|
Sanders, S C
|
Published by the Institute of Electrical and Electronics Engineers for the Magnetics Group
|
2000
|
|
|
|
| 340 |
|
PART I - Exchange Bias and Heads - Structure and Magnetic Properties of (001) NiFe/NiMn/Co/
|
Lai, C-H
|
Published by the Institute of Electrical and Electronics Engineers for the Magnetics Group
|
2000
|
|
|
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