| 401 |
|
Measurement of vacuum; 1950-2003/
|
Redhead, P. A
|
Published for the Society by the American Institute of Physics
|
2003
|
|
|
|
| 402 |
|
Measurements of neutral plasma species in an argon/isopropyl alcohol plasma for the deposition of organic films/
|
Guerin, D. C
|
Published for the Society by the American Institute of Physics
|
2003
|
|
|
|
| 403 |
|
Measurements of photon stimulated desorption from thick and thin oxide of KEKB collider copper beam chambers and a stainless steel beam chamber/
|
Foerster, C L
|
Published for the Society by the American Institute of Physics
|
2001
|
|
|
|
| 404 |
|
Measurements of the critical inclusion size for arcing and macroparticle election from aluminum sputtering targets/
|
Wickersham Jr, C E
|
Published for the Society by the American Institute of Physics
|
2001
|
|
|
|
| 405 |
|
Measuring vacuum ultraviolet radiation-induced damage/
|
Lauer, J. L
|
Published for the Society by the American Institute of Physics
|
2003
|
|
|
|
| 406 |
|
Mechanical and etching properties of dual ion beam deposited hydrogen-free silicon nitride films/
|
Tsang, M P
|
Published for the Society by the American Institute of Physics
|
2001
|
|
|
|
| 407 |
|
Mechanical and tribological properties of sub- and superstoichiometric Ti-C and Ti-Si-C films deposited by magnetron sputtering-pulsed laser deposition/
|
Krzanowski, J. E
|
Published for the Society by the American Institute of Physics
|
2003
|
|
|
|
| 408 |
|
Mechanism of hardening in Cr-Al-N-O thin films prepared by pulsed laser deposition/
|
Hirai, M
|
Published for the Society by the American Institute of Physics
|
2003
|
|
|
|
| 409 |
|
Mechanism of the film composition formation during magnetron sputtering of WTi/
|
Shaginyan, L R
|
Published for the Society by the American Institute of Physics
|
2001
|
|
|
|
| 410 |
|
Mechanism of the isotermic amorphous-to-crystal line phase transition in Ge:Sb:Te ternary alloys/
|
Gonz�lez-Hern�ndez, J
|
Published for the Society by the American Institute of Physics
|
2001
|
|
|
|
| 411 |
|
Mechanisms for CF2 radical generation and loss on surfaces in fluorocarbon plasmas/
|
Zhang, Da
|
Published for the Society by the American Institute of Physics
|
2000
|
|
|
|
| 412 |
|
Mechanisms for deposition and etching in fluorosilane plasma processing of silicon/
|
Williams, K. L
|
Published for the Society by the American Institute of Physics
|
2003
|
|
|
|
| 413 |
|
Metal deposition with femtosecond light pulses at atmospheric pressure/
|
Haight, R
|
Published for the Society by the American Institute of Physics
|
2003
|
|
|
|
| 414 |
|
Metallic electronic states on SrTiO3 (110) surface: An in situ conduction measurement/
|
Bando, Hiroshi
|
Published for the Society by the American Institute of Physics
|
2001
|
|
|
|
| 415 |
|
Metallization schemes for radio frequency microelectromechanical system switches
|
Leedy, K. D
|
Published for the Society by the American Institute of Physics
|
2003
|
|
|
|
| 416 |
|
Metal-organic interface and charge injection in organic electronic devices/
|
Scott, J. C
|
Published for the Society by the American Institute of Physics
|
2003
|
|
|
|
| 417 |
|
Method for calculation of gas flow in the whole pressure regime through ducts of any length/
|
Livesey, R G
|
Published for the Society by the American Institute of Physics
|
2001
|
|
|
|
| 418 |
|
Method for navigating two scanning probes to a common point without additional microscopes/
|
Okamoto, Hiroshi
|
Published for the Society by the American Institute of Physics
|
2001
|
|
|
|
| 419 |
|
Method to characterize the three-dimensional distribution of focused ion beam induced damage in silicon after 50 keV Ga^+ irradiation/
|
Lugstein, A
|
Published for the Society by the American Institute of Physics
|
2003
|
|
|
|
| 420 |
|
Metrology of 1-10 nm thick CN~x films: Thickness, density, and surface roughness measurements/
|
Li, D
|
Published for the Society by the American Institute of Physics
|
2003
|
|
|
|
Valentini, L
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