| 501 |
|
Plasma-surface interactions/
|
Chang, J. P
|
Published for the Society by the American Institute of Physics
|
2003
|
|
|
|
| 502 |
|
Postdeposition annealing of pulsed laser deposited CNx films/
|
Gonz�lez, P
|
Published for the Society by the American Institute of Physics
|
2000
|
|
|
|
| 503 |
|
Potassium reaction on sulfur-passivated GaAs(100)/
|
Seo, J M
|
Published for the Society by the American Institute of Physics
|
2000
|
|
|
|
| 504 |
|
Potential application of tungsten carbides as electrocatalysts/
|
Hwu, H. H
|
Published for the Society by the American Institute of Physics
|
2003
|
|
|
|
| 505 |
|
Powder formation in germane-silane plasmas/
|
Swaaij, R A C M M van
|
Published for the Society by the American Institute of Physics
|
2000
|
|
|
|
| 506 |
|
Preferential resputtering phenomenon on the surface of (100)-oriented Ni-Pt films: Effect of substrate bias during sputter deposition/
|
Shi, J
|
Published for the Society by the American Institute of Physics
|
2001
|
|
|
|
| 507 |
|
Preliminary Program of the 47th International Symposium of the American Vacuum Society Program and Exhibitors/
|
|
Published for the Society by the American Institute of Physics
|
2000
|
|
|
|
| 508 |
|
Preparation and characterization of clean, single-crystal line YHx films (0<=x<=2.9) on W(110)/
|
Hayoz, J
|
Published for the Society by the American Institute of Physics
|
2000
|
|
|
|
| 509 |
|
Preparation and characterization of superhard boron-suboxide films/
|
Huang, H
|
Published for the Society by the American Institute of Physics
|
2003
|
|
|
|
| 510 |
|
Preparation and properties of transparent conductive aluminum-doped zinc oxide thin films by sol-gel process/
|
Alam, M J
|
Published for the Society by the American Institute of Physics
|
2001
|
|
|
|
| 511 |
|
Preparation of cross-sectional transmission electron microscopy specimens of obliquely deposited magnetic thin films on a flexible tape/
|
Keim, Enrico G
|
Published for the Society by the American Institute of Physics
|
2001
|
|
|
|
| 512 |
|
Preparation of transmission electron microscopy cross-section specimens using focused ion beam milling/
|
Langford, R M
|
Published for the Society by the American Institute of Physics
|
2001
|
|
|
|
| 513 |
|
Present status of the KEK B-factory vacuum system/
|
Suetsugu, Y
|
Published for the Society by the American Institute of Physics
|
2003
|
|
|
|
| 514 |
|
Pressure and input power dependence of Ar/N2H2 inductively coupled plasma systems/
|
Jang, Seongsoo
|
Published for the Society by the American Institute of Physics
|
2001
|
|
|
|
| 515 |
|
Pressure dependent mode transition in an electron cyclotron resonance plasma discharge/
|
Aanesland, Ane
|
Published for the Society by the American Institute of Physics
|
2001
|
|
|
|
| 516 |
|
Process window extension of TiN diffusion barrier using preoxidation of Ru and RuOx film for (Ba,Sr)TlO3 dielectric film/
|
Yoon, Dong-Soo
|
Published for the Society by the American Institute of Physics
|
2001
|
|
|
|
| 517 |
|
Product development and yield enhancement through failure analysis of integrated circuits with scanning capacitance microscopy/
|
Tangyunyong, P
|
Published for the Society by the American Institute of Physics
|
2003
|
|
|
|
| 518 |
|
Profile coatings and their applications/
|
Liu, C
|
Published for the Society by the American Institute of Physics
|
2003
|
|
|
|
| 519 |
|
Progress in electronic materials characterization/
|
Holloway, P. H
|
Published for the Society by the American Institute of Physics
|
2003
|
|
|
|
| 520 |
|
Progress in spectroscopic ellipsometry: Applications from vacuum ultraviolet to infrared/
|
Hilfiker, J. N
|
Published for the Society by the American Institute of Physics
|
2003
|
|
|
|