| 101 |
|
Correlation between crystallographic orientations and Raman spectra of TiO~2 sputtered films with changing degrees of plasma exposure/
|
Takahashi, T
|
Published for the Society by the American Institute of Physics
|
2003
|
|
|
|
| 102 |
|
Correlation between microstructural and magnetic properties in Fe/KCoF~3 bilayers/
|
Malkinski, L
|
Published for the Society by the American Institute of Physics
|
2003
|
|
|
|
| 103 |
|
Corrosion behavior of sputter-deposited TiN thin films/
|
Martin-Palma, R. J
|
Published for the Society by the American Institute of Physics
|
2003
|
|
|
|
| 104 |
|
Corrosion behaviors of CrNx and (Ti1-xCrx)N coatings produced by ion plating/
|
Lee, Kwang Hee
|
Published for the Society by the American Institute of Physics
|
2001
|
|
|
|
| 105 |
|
Corrosion resistance of chromium nitride on low alloy steels by cathodic arc deposition/
|
Han, S
|
Published for the Society by the American Institute of Physics
|
2001
|
|
|
|
| 106 |
|
Critical tasks in high aspect ratio silicon dry etching for microelectromechanical systems/
|
Rangelow, I. W
|
Published for the Society by the American Institute of Physics
|
2003
|
|
|
|
| 107 |
|
Cross-sectional transmission electron microscopy investigation of the dead layer of ZnS:Ag,Al phosphors in field emission displays/
|
Kajiwara, K
|
Published for the Society by the American Institute of Physics
|
2001
|
|
|
|
| 108 |
|
Crystallization kinetics in amorphous (Zr0.52Al0.38)O1.8 thin films/
|
Dover, R B van
|
Published for the Society by the American Institute of Physics
|
2001
|
|
|
|
| 109 |
|
Crystallization of amorphous-silicon films with seed layers of microcrystalline silicon by plasma heating/
|
Kim, Hae-Yeol
|
Published for the Society by the American Institute of Physics
|
2000
|
|
|
|
| 110 |
|
CUMULATIVE AUTHOR INDEX ///
|
|
Published for the Society by the American Institute of Physics
|
2001
|
|
|
|
| 111 |
|
CUMULATIVE AUTHOR INDEX ///
|
|
Published for the Society by the American Institute of Physics
|
2000
|
|
|
|
| 112 |
|
Damage effects from medium-energy ion bombardment during the growth of cubic-boron nitride films/
|
Gago, R
|
Published for the Society by the American Institute of Physics
|
2003
|
|
|
|
| 113 |
|
Damage in diamond produced by analysis beam/
|
Ma, Z Q
|
Published for the Society by the American Institute of Physics
|
2000
|
|
|
|
| 114 |
|
Damage of InP (110) induced by low energy Ar+ and He+ bombardment/
|
Zhao, Q
|
Published for the Society by the American Institute of Physics
|
2000
|
|
|
|
| 115 |
|
dc cathodic polymerization of trimethylsilane in a closed reactor system/
|
Yu, Qingsong
|
Published for the Society by the American Institute of Physics
|
2001
|
|
|
|
| 116 |
|
dc field-emission analysis of GaAs and plasma-source ion-implanted stainless steel/
|
Hernandez, C
|
Published for the Society by the American Institute of Physics
|
2003
|
|
|
|
| 117 |
|
Defect characterization of silver-based low-emissivity multilayer coatings for energy-saving applications/
|
Mart�-Palma, R J
|
Published for the Society by the American Institute of Physics
|
2001
|
|
|
|
| 118 |
|
Degradation of CrN films at high temperature under controlled atmosphere/
|
Lu, F.-H
|
Published for the Society by the American Institute of Physics
|
2003
|
|
|
|
| 119 |
|
Dependence of compositions and crystallization behaviors of dc-sputtered TiNi thin films on the deposition conditions/
|
Ting, Jyh-Ming
|
Published for the Society by the American Institute of Physics
|
2001
|
|
|
|
| 120 |
|
Dependence of energy gaps with the stoichiometric deviation in a CuIn0.5Ga0.5Se2 ingot: A schematic band model/
|
D�z, R
|
Published for the Society by the American Institute of Physics
|
2001
|
|
|
|