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유형		 서명 저자 발행처 원문제공시작년 수록
매체
461 저널기사 Characterization of low-frequency noise in molecular beam epitaxy-grown GaN epilayers deposited on double buffer layers/ 미리보기
Fong, W. K American Institute of Physics 2003
462 저널기사 Characterization of magnetization processes in nanostructured rare earth-transition metal films/ 미리보기
Zheng, G.-p American Institute of Physics 2003
463 저널기사 Characterization of magnetron sputtering deposited thin films of TiN for use as a metal electrode on TiN/SiO2/Si metal-oxide-semiconductor devices/ 미리보기
Evangelou, E K American Institute of Physics 2000
464 저널기사 Characterization of metal-containing carbon films using Raman scattering/ 미리보기
Huang, Q F American Institute of Physics 2001
465 저널기사 Characterization of metallic impurities in Si using a recombination-lifetime correlation method 미리보기
Itsumi, M American Institute of Physics 1980
466 저널기사 Characterization of minor loops using Preisach-based models 미리보기
Vajda, F American Institute of Physics 1980
467 저널기사 Characterization of mixed strain quantum well structures 미리보기
Uppal, K American Institute of Physics 1980
468 저널기사 Characterization of multilayer HgCdTe heterostructures by differential absorption spectroscopy 미리보기
Ariel, V American Institute of Physics 1980
469 저널기사 Characterization of multilayers by Fourier analysis of x-ray reflectivity 미리보기
Voorma, H. J American Institute of Physics 1980
470 저널기사 Characterization of nanocrystalline diamond films by core-level photoabsorption 미리보기
Gruen, D. M American Institute of Physics 1980
471 저널기사 Characterization of nanocrystalline Ni~3~3Zr~6~7 alloy 미리보기
Liu, X. D American Institute of Physics 1980
472 저널기사 Characterization of nanopipes/dislocations in silicon carbide using ballistic electron emission microscopy/ 미리보기
Reddy, C V American Institute of Physics 2001
473 저널기사 Characterization of nanostructured metal films by picosecond acoustics and interferometry/ 미리보기
O'Hara, K E American Institute of Physics 2001
474 저널기사 Characterization of nonradiative traps by hot electron-hole plasma luminescence dynamics in polar semiconductors 미리보기
Jursenas, S American Institute of Physics 1980
475 저널기사 Characterization of paramagnetic defect centers in three polytypes of dry heat treated, oxidized SiC/ 미리보기
Macfarlane, P J American Institute of Physics 2000
476 저널기사 Characterization of Permalloy thin films electrodeposited on Si(111) surfaces 미리보기
Gao, L. J American Institute of Physics 1980
477 저널기사 Characterization of phosphorus-doped and boron-doped diamond-like carbon emitter arrays/ 미리보기
Tsai, Chia-Lun American Institute of Physics 2001
478 저널기사 Characterization of photoinduced birefringence change in optical fiber rocking filters 미리보기
Psaila, D. C American Institute of Physics 1980
479 저널기사 Characterization of photoluminescence intensity and efficiency of free excitons in semiconductor quantum well structures 미리보기
Jin, S American Institute of Physics 1980
480 저널기사 Characterization of photonic dots in Si/SiO2 thin-film structures/ 미리보기
Porjo, N American Institute of Physics 2001
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