| 281 |
|
Effect of microstructure on the magnetic properties of L1~0 CoPt-20 at.%C magnetic thin film/
|
Oh, D. Y
|
American Institute of Physics
|
2003
|
|
|
|
| 282 |
|
Effect of microstructure on the magnetoresistive properties of NiFe/Co(CoFe)/Al(Ta)-oxide/Co(CoFe) tunnel junctions/
|
Kyung, H
|
American Institute of Physics
|
2001
|
|
|
|
| 283 |
|
Effect of microstructure on the oscillating interlayer coupling in spin-valve structures/
|
Kools, J. C. S
|
American Institute of Physics
|
2003
|
|
|
|
| 284 |
|
Effect of Mn substitution on magnetoelectric properties of bismuth ferrite system/
|
Palkar, V. R
|
American Institute of Physics
|
2003
|
|
|
|
| 285 |
|
Effect of Mo content on the structure stability of R~3(Fe,Co,Mo)~2~9/
|
Li, W. X
|
American Institute of Physics
|
2003
|
|
|
|
| 286 |
|
Effect of moderate heating on the negative electron affinity and photoyield ofair-exposedhydrogen-terminatedchemicalvapordeposited diamond/
|
Piantanida, G
|
American Institute of Physics
|
2001
|
|
|
|
| 287 |
|
Effect of multiplication layer width on breakdown voltage in InP/InGaAs avalanche photodiode
|
Park, C.-Y
|
American Institute of Physics
|
1980
|
|
|
|
| 288 |
|
Effect of multistep wafer-annealing on main traps in Czochralski-grown semi-insulating GaAs
|
Fang, Z.-Q
|
American Institute of Physics
|
1980
|
|
|
|
| 289 |
|
Effect of N~2 addition in sputter gas on giant magnetoresistance response of PtMn bottom spin-valve films/
|
Mao, M
|
American Institute of Physics
|
2003
|
|
|
|
| 290 |
|
Effect of nanometer-scale corrugation on densities of gap states and fixed charges at the thermally grown SiO2/Si interface/
|
Ishikawa, Yasuhiko
|
American Institute of Physics
|
2001
|
|
|
|
| 291 |
|
Effect of nanoscale surface roughness on the bonding energy of direct-bonded silicon wafers/
|
Miki, N
|
American Institute of Physics
|
2003
|
|
|
|
| 292 |
|
Effect of near-interfacial nitrogen on the oxidation behavior of ultrathin silicon oxynitrides
|
Lu, H. C
|
American Institute of Physics
|
1980
|
|
|
|
| 293 |
|
Effect of negative capacitances on high-temperature dielectric measurements at relatively low frequency
|
M'Peko, J.-C
|
American Institute of Physics
|
1980
|
|
|
|
| 294 |
|
Effect of negative ions on filamentation instability in collisionless three-fluid theory of plasmas with cold ion species
|
Guan Sik Cho
|
American Institute of Physics
|
1980
|
|
|
|
| 295 |
|
Effect of neodymium (Nd) doping on the dielectric and ferroelectric characteristics of sol-gel derived lead zirconate titanate (53/47) thin films/
|
Majumder, S B
|
American Institute of Physics
|
2001
|
|
|
|
| 296 |
|
Effect of neutron irradiation on magnetic properties in the low alloy Ni-Mo steel SA508-3
|
Park, D. G
|
American Institute of Physics
|
1980
|
|
|
|
| 297 |
|
Effect of NiAl intermediate layer on structural and magnetic properties of L1~0 FePt films with perpendicular anisotropy/
|
Chen, J. S
|
American Institute of Physics
|
2003
|
|
|
|
| 298 |
|
Effect of nitrogen incorporation on electrical properties of boron-dopeddiamond films
|
Sonoda, S
|
American Institute of Physics
|
1980
|
|
|
|
| 299 |
|
Effect of nitrogen interstitial in �Fe crystalline on the magnetic softproperties of FeTaN thin films
|
Chang, W. C
|
American Institute of Physics
|
1980
|
|
|
|
| 300 |
|
Effect of nitrogen-oxygen complex on electrical properties of Czochralski silicon
|
Yang, D
|
American Institute of Physics
|
1980
|
|
|
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