| 341 |
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Effect of purification of the electrical conductivity and complex permittivity of multiwall carbon nanotubes/
|
Grimes, C A
|
American Institute of Physics
|
2001
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| 342 |
|
Effect of pyrolysis temperature on the magnetic properties of the carbonmaterials prepared from trialkylboranes
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Murata, K
|
American Institute of Physics
|
1980
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| 343 |
|
Effect of radiation-induced defects on silicon solar cells/
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Karazhanov, S Zh
|
American Institute of Physics
|
2000
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| 344 |
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Effect of radio-frequency noise suppression on the coplanar transmission line using soft magnetic thin films/
|
Kim, K. H
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American Institute of Physics
|
2003
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|
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| 345 |
|
Effect of rapid thermal annealing on carrier lifetimes of arsenic-ion-implanted GaAs
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Lin, G.-R
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American Institute of Physics
|
1980
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|
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| 346 |
|
Effect of rapid thermal annealing on the electrical and physical properties of metalorganic chemical-vapor-deposited TiN
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Sun, S. C
|
American Institute of Physics
|
1980
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|
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| 347 |
|
Effect of reaction time and P content on mechanical strength of the interface formed between eutectic Sn-Ag solder and Au/electroless Ni(P)/Cu bond pad/
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Alam, M. O
|
American Institute of Physics
|
2003
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| 348 |
|
Effect of reactive ion etching-generated sidewall roughness on propagation loss of buried-channel silica waveguides
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Bazylenko, M. V
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American Institute of Physics
|
1980
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| 349 |
|
Effect of reader saturation on the measurements of NLTS in perpendicular recording/
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Chen, J
|
American Institute of Physics
|
2003
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| 350 |
|
Effect of readout magnetic-field direction on trilayer magnetically induced super resolution media
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Tamanoi, K
|
American Institute of Physics
|
1980
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|
|
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| 351 |
|
Effect of repetition rate of a pulsed microwave diamond forming plasma on the density of C2/
|
Khachan, J
|
American Institute of Physics
|
2000
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|
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| 352 |
|
Effect of rigid toroidal rotation on the stability of a tokamak plasma to tearing modes
|
Urquijo, G
|
American Institute of Physics
|
1980
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|
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| 353 |
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Effect of rotation on stability of suspended sediments/
|
Chakraborty, B B
|
American Institute of Physics
|
2000
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|
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| 354 |
|
Effect of roughness on the measurement of nanohardness - a computer simulation study
|
Bobji, M. S
|
American Institute of Physics
|
1980
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|
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| 355 |
|
Effect of Ru substitution for Re on the thermoelectric properties of AlPdRe icosahedral quasicrystals/
|
Nagata, T
|
American Institute of Physics
|
2003
|
|
|
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| 356 |
|
Effect of Sb as a surfactant during the lateral epitaxial overgrowth of GaN by metalorganic vapor phase epitaxy/
|
Zhang, L
|
American Institute of Physics
|
2001
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|
|
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| 357 |
|
Effect of Sb doping on the thermoelectric properties of Ti-based half-Heusler compounds, TiNiSn1-xSbx/
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Bhattacharya, S
|
American Institute of Physics
|
2000
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|
|
|
| 358 |
|
Effect of scan size and surface roughness on microscale friction measurements
|
Koinkar, V. N
|
American Institute of Physics
|
1980
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|
|
|
| 359 |
|
Effect of secondary electron emission on sheath potential in an electroncyclotron resonance plasma
|
Yao, X. Z
|
American Institute of Physics
|
1980
|
|
|
|
| 360 |
|
Effect of shear on order-disorder and order-order transitions in block copolymers
|
Huang, C.-Y
|
American Institute of Physics
|
1980
|
|
|
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