| 1481 |
|
Electrostriction effects on electron transfer reactions in solution. I. Adiabatic regime
|
Jeon, J
|
American Institute of Physics
|
1980
|
|
|
|
| 1482 |
|
Electrostriction of polarizable materials: Comparison of models with experimental data
|
Shkel, Y. M
|
American Institute of Physics
|
1980
|
|
|
|
| 1483 |
|
Electrothermal failure of metallized film capacitor end connections-computation of temperature rise at connection spots/
|
Qi, X
|
American Institute of Physics
|
2003
|
|
|
|
| 1484 |
|
Electrowetting-based actuation of liquid droplets for microfluidic applications/
|
Pollack, Michael G
|
American Institute of Physics
|
2000
|
|
|
|
| 1485 |
|
Element specific x-ray magnetic circular dichroism magnetization curves using total electron yield/
|
Goering, Eberhard
|
American Institute of Physics
|
2000
|
|
|
|
| 1486 |
|
Eley-Rideal and hot-atom reaction dynamics of H(g) with H adsorbed on Cu(111)
|
Caratzoulas, S
|
American Institute of Physics
|
1980
|
|
|
|
| 1487 |
|
Elimination of endpoint-discontinuity artifacts in the analysis of spectra in reciprocal space/
|
Yoo, S D
|
American Institute of Physics
|
2001
|
|
|
|
| 1488 |
|
Elimination of high order terms in multiple pulse nuclear magnetic resonance spectroscopy: Application to homonuclear decoupling in solids
|
Hohwy, M
|
American Institute of Physics
|
1980
|
|
|
|
| 1489 |
|
Elimination of nonuniformities in thick GaN films using metalorganic chemical vapor deposited GaN templates/
|
Valcheva, E
|
American Institute of Physics
|
2001
|
|
|
|
| 1490 |
|
Elimination of orientation domains and antiphase domains in the epitaxial films with chalcopyrite structure
|
Tseng, B.-H
|
American Institute of Physics
|
1980
|
|
|
|
| 1491 |
|
Elimination of SiC/SiO~2 interface states by preoxidation ultraviolet-ozone cleaning
|
Afanas'ev, V. V
|
American Institute of Physics
|
1980
|
|
|
|
| 1492 |
|
Elimination of three-dimensional waves in a film flow
|
Lin, S. P
|
American Institute of Physics
|
1980
|
|
|
|
| 1493 |
|
Ellipsometric and thermoreflectance spectra of (Al~xGa~1~-~x)~0~.~5In~0~.~5P alloys
|
Ozaki, S
|
American Institute of Physics
|
1980
|
|
|
|
| 1494 |
|
Ellipsometric characterization of amorphous and polycrystalline silicon films deposited using a single wafer reactor
|
Borghesi, A
|
American Institute of Physics
|
1980
|
|
|
|
| 1495 |
|
Ellipsometric measurement of solid fluorocarbon film thickness on magnetic recording media
|
Karis, T. E
|
American Institute of Physics
|
1980
|
|
|
|
| 1496 |
|
Ellipsometric monitoring of an oriented diamond nucleation process in bias-enhanced chemical vapor deposition
|
Hayashi, Y
|
American Institute of Physics
|
1980
|
|
|
|
| 1497 |
|
Ellipsometric studies of Cd~1~-~xMg~xTe (0��.5) alloys
|
Choi, S. G
|
American Institute of Physics
|
1980
|
|
|
|
| 1498 |
|
Ellipsometric study of InAs wetting layer in InAs/GaAs quantum dots at the threshold of quantum dot formation/
|
Lee, Hosun
|
American Institute of Physics
|
2001
|
|
|
|
| 1499 |
|
Ellipsometric study of silicon nanocrystal optical constants/
|
Amans, D
|
American Institute of Physics
|
2003
|
|
|
|
| 1500 |
|
Elliptical air hole waveguides in slab photonic crystals/
|
Sigalas, M. M
|
American Institute of Physics
|
2003
|
|
|
|
