1 |
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Icosahedra of icosahedra: The stability of (C~6~0)~1~3
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Hansen, K
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American Institute of Physics
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1980
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2 |
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Ideal anodization of silicon
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Yamani, Z
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American Institute of Physics
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1980
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3 |
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Ideal magnetohydrodynamic instabilities with low toroidal mode numbers localized near an internal transport barrier in high-�p mode plasmas in the Japan Atomic Energy Research Institute Tokamak-60 Upgrade
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Takeji, S
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American Institute of Physics
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1980
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4 |
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Ideal n=3 phase Ca4Mn3O10 of Ruddlesden-Popper series obtained using high pressure and high temperature/
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Yu, R C
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American Institute of Physics
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2001
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5 |
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Ideal Ohmic contact to n-type 6H-SiC by reduction of Schottky barrier height
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Teraji, T
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American Institute of Physics
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1980
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6 |
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Identification and optimization of advanced phosphors using combinatorial libraries
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Sun, X.-D
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American Institute of Physics
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1980
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7 |
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Identification of aging mechanisms in the optical and electrical characteristics of light-emitting diodes/
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Pursiainen, Otto
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American Institute of Physics
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2001
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8 |
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Identification of a high-temperature magnetic phase transition in ball-milled and compacted nanocrystalline Fe-Cu alloys
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Shull, R. D
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American Institute of Physics
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1980
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9 |
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Identification of a Pb-related Ti3+ center in flux-grown KTiOPO4/
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Stevens, K T
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American Institute of Physics
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2000
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10 |
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Identification of compositionally invariant deep levels introduced by plastic strain in epitaxial Ge~0~.~3~0Si~0~.~7~0 and deformed bulk Si
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Grillot, P. N
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American Institute of Physics
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1980
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11 |
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Identification of Cr in p-type silicon using the minority carrier lifetime measurement by the surface photovoltage method
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Mishra, K
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American Institute of Physics
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1980
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12 |
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Identification of defects associated with second-order optical nonlinearity in thermally poled high-purity silica glasses/
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Kameyama, Akihiro
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American Institute of Physics
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2001
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13 |
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Identification of electron and hole traps in KH2PO4 crystals/
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Garces, N Y
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American Institute of Physics
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2001
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14 |
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Identification of first and second layer aluminum atoms in dilute AlGaAsusing cross-sectional scanning tunneling microscopy
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Smith, A. R
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American Institute of Physics
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1980
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15 |
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Identification of isolation-edge related random telegraph signals in submicron silicon metal-oxide-semiconductor field-effect transistors
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Lukyanchikova, N
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American Institute of Physics
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1980
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16 |
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Identification of room temperature photoluminescence in pseudomorphic modulation-doped AlGaAs/InGaAs/GaAs quantum wells
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Lu, W
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American Institute of Physics
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1980
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17 |
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Identification of Si and SiH in catalytic chemical vapor deposition of SiH4 by laser induced fluorescence spectroscopy/
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Nozaki, Yoshitaka
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American Institute of Physics
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2000
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18 |
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Identification of the G5 and G6 free excitons in GaN/
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Reynolds, D C
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American Institute of Physics
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2000
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19 |
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Identification of the mechanism-limiting nitrogen diffusion in metallic alloys by in situ photoemission electron spectroscopy/
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Figueroa, C. A
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American Institute of Physics
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2003
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20 |
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Identification of the symmetry of phonon modes in CsPbCl~3 in phase IV by Raman and resonance-Raman scattering
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Calistru, D. M
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American Institute of Physics
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1980
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