| 681 |
|
In situ real-time study of chemical etching process of Si(100) using light scattering
|
Zhao, Y.-P
|
American Institute of Physics
|
1980
|
|
|
|
| 682 |
|
In situ reflectance difference spectroscopy and reflection high-energy electron diffraction observation of nitridation processes on GaAs(001) surfaces
|
Jung, H. D
|
American Institute of Physics
|
1980
|
|
|
|
| 683 |
|
In situ reflectance monitoring of InP/InGaAsP films grown by metalorganic vapor phase epitaxy
|
Lum, R. M
|
American Institute of Physics
|
1980
|
|
|
|
| 684 |
|
In situ scanning tunneling microscopic study of polymerization of C60 clusters induced by electron injection from the probe tips/
|
Nakamura, Y
|
American Institute of Physics
|
2000
|
|
|
|
| 685 |
|
Insitu scanning tunneling microscopy observation of surface evolution magnetically coupled Co/Cu multilayers
|
Minvielle, T. J
|
American Institute of Physics
|
1980
|
|
|
|
| 686 |
|
In situ scanning tunneling microscopy of GaAs(001), (111)A, and (111)B surfaces in sulfuric acid solution
|
Yao, H
|
American Institute of Physics
|
1980
|
|
|
|
| 687 |
|
In situ selective etching of GaAs for improving (Al)GaAs interfaces using tris-dimethylaminoarsenic
|
Li, N. Y
|
American Institute of Physics
|
1980
|
|
|
|
| 688 |
|
In situ sensor for interstitial trapping during Si thermal oxidation using He implantation-induced voids/
|
Raineri, Vito
|
American Institute of Physics
|
2001
|
|
|
|
| 689 |
|
In situ Si flux cleaning technique for producing atomically flat Si(100)surfaces at low temperature
|
Wilk, G. D
|
American Institute of Physics
|
1980
|
|
|
|
| 690 |
|
In situ single wavelength ellipsometry studies of high rate hydrogenated amorphous silicon growth using a remote expanding thermal plasma/
|
Smets, A H M
|
American Institute of Physics
|
2000
|
|
|
|
| 691 |
|
In situ temperature measurements via ruby R lines of sapphire substrate based InGaN light emitting diodes during operation/
|
Winnewisser, C
|
American Institute of Physics
|
2001
|
|
|
|
| 692 |
|
Insitu time-resolved optical studies of Al oxidation for magnetic tunnel junctions/
|
Knechten, K
|
American Institute of Physics
|
2001
|
|
|
|
| 693 |
|
In situ transmission electron microscopy study of Ni silicide phases formed on (001) Si active lines/
|
Teodorescu, V
|
American Institute of Physics
|
2001
|
|
|
|
| 694 |
|
In situ transmission electron microscopy study of plastic deformation and stress-induced voiding in Al-Cu interconnects
|
Jawarani, D
|
American Institute of Physics
|
1980
|
|
|
|
| 695 |
|
In situ transmission electron microscopy study of plastic deformation inpassivated Al Cu thin films
|
Jawarani, D
|
American Institute of Physics
|
1980
|
|
|
|
| 696 |
|
In situ x-ray diffraction study of the antiferroelectric-ferroelectric phase transition in PLSnZT
|
Blue, C. T
|
American Institute of Physics
|
1980
|
|
|
|
| 697 |
|
Instabilities in electroluminescent porous silicon diodes
|
Linnros, J
|
American Institute of Physics
|
1980
|
|
|
|
| 698 |
|
Instabilities in plane Poiseuille flow due to the combined effects of stratification and viscosity
|
Ng, B. S
|
American Institute of Physics
|
1980
|
|
|
|
| 699 |
|
Instabilities of a liquid layer locally heated on its free surface
|
Favre, E
|
American Institute of Physics
|
1980
|
|
|
|
| 700 |
|
Instabilities of Ar/SF~6 inductive plasma discharges/
|
Tuszewski, M
|
American Institute of Physics
|
2003
|
|
|
|
기사
(1439)
