충남대학교 외국학술지지원센터

글로벌메뉴

주메뉴

이용안내
원문검색
센터소개
- 소개
- 연혁
- 운영시간
- 조직
게시판
- 이용안내
- 원문검색
- 센터소개
  - 소개
  - 연혁
  - 운영시간
  - 조직
- 게시판

CNU Search

|Home >
원문검색>
CNU Search>
가나다리스트

탭메뉴

전체 ㅣ A B C D E F G H I J K L M N O P Q R S T U V W X Y Z ㅣ 가 나 다 라 마 바 사 아 자 차 카 타 파 하 기타

검색어[가나다ABC : M]

총 2,224건 중 2,224건 출력

51/112 페이지

제한항목: American Institute of Physics

검색간략리스트

검색리스트 테이블
No	서명	저자	발행처	원문제공시작년
1001	Measurement and analysis of leaded glass polycapillary optic performance for hard x rays/	Suparmi	American Institute of Physics	2001

1002	Measurement and analysis of nonhydrostatic lattice strain component in niobium to 145 GPa under various fluid pressure-transmitting media/	Singh, Anil K	American Institute of Physics	2001

1003	Measurement and analysis of the scattered light in the critical ionic solution of ethylammonium nitrate in n-octanol	Bonetti, M	American Institute of Physics	1980

1004	Measurement and interpretation of current transmission in a crossed-field diode below cutoff	Vanderberg, B. H	American Institute of Physics	1980

1005	Measurement and manipulation of Mn clusters on clean and fullerene terminated Si(111)-7x7	Upward, M. D	American Institute of Physics	1980

1006	Measurement of absolute differential cross sections for the excitation of the �	Asmis, K. R	American Institute of Physics	1980

1007	Measurement of absorption line wing structure by wavelength modulation spectroscopy	Bullock, A. M	American Institute of Physics	1980

1008	Measurement of and hypothesis for particle influx and density peaking ina tokamak plasma	Chu, T. K	American Institute of Physics	1980

1009	Measurement of built-in electrical potential in III-V solar cells by scanning Kelvin probe microscopy/	Jiang, C.-S	American Institute of Physics	2003

1010	Measurement of clottability of fibrin polymers using magnetic orientation	Iwasaka, M	American Institute of Physics	1980

1011	Measurement of complex optical constants of a highly doped Si wafer using terahertz ellipsometry/	Nagashima, Takeshi	American Institute of Physics	2001

1012	Measurement of depth-dependent atomic concentration profiles in CdTe/Hg~1 ~- ~xCd~xTe structures	Mainzer, N	American Institute of Physics	1980

1013	Measurement of doping concentration in boron-doped diamond film from capacitance spectroscopy	Liu, K	American Institute of Physics	1980

1014	Measurement of elastic force on a scanned probe near a solid surface	Drummond Roby, M. A	American Institute of Physics	1980

1015	Measurement of electron affinity in boron-doped diamond from capacitancespectroscopy	Liu, K	American Institute of Physics	1980

1016	Measurement of electro-optic effects in single crystal films of N-(4-nitrophenyl)-L-prolinol	Xu, J	American Institute of Physics	1980

1017	Measurement of evoked electroencephalography induced by transcranial magnetic stimulation/	Iramina, K	American Institute of Physics	2003

1018	Measurement of femtosecond resonant nonlinear refraction in Nd:YVO4 by degenerate pump-probe spectroscopy/	Luo, L	American Institute of Physics	2001

1019	Measurement of fly height by scattered total internal reflection	Lo, J. L	American Institute of Physics	1980

1020	Measurement of index of refraction of In~xAl~1~-~xAs epitaxial layer using in situ laser reflectometry	Baek, J.-H	American Institute of Physics	1980

51 52 53 54 55 56 57 58 59 60

임시보관함보기

글로벌메뉴

주메뉴

CNU Search

탭메뉴

검색간략리스트

하단메뉴