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제한항목: American Institute of Physics

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검색리스트 테이블
No	서명	저자	발행처	원문제공시작년
1041	Measurement of silicon surface recombination velocity using ultrafast pump-probe reflectivity in the near infrared/	Sabbah, A J	American Institute of Physics	2000

1042	Measurement of single interface trap capture cross sections with charge pumping	Saks, N. S	American Institute of Physics	1980

1043	Measurement of single mode imprint in laser ablative drive of a thin Al foil by extreme ultraviolet laser radiography	Wolfrum, E	American Institute of Physics	1980

1044	Measurement of Si, SiF, and SiF~2 radicals and SiF~4 molecule using very high frequency capacitively coupled plasma employing SiF~4/	Ohta, T	American Institute of Physics	2003

1045	Measurement of stiffness coefficients of anisotropic materials from pointlike generation and detection of acoustic waves	Audoin, B	American Institute of Physics	1980

1046	Measurement of surface displacements in 1-3 and 1-1-3 piezocomposites	Li, L	American Institute of Physics	1980

1047	Measurement of texture in magnetic recording media using a biaxial vibrating sample magnetometer	Schmidlin, F	American Institute of Physics	1980

1048	Measurement of the band offsets of SiO~2 on clean n- and p-type GaN(0001)/	Cook, T. E	American Institute of Physics	2003

1049	Measurement of the crystalline anisotropy in sputtered single-crystal FeTaN thin films	Varga, L	American Institute of Physics	1980

1050	Measurement of the d36 coefficient of mercury cadmium telluride by reflection second harmonic generation/	Wark, A W	American Institute of Physics	2001

1051	Measurement of the depth distribution of ion beam etching-induced damagein AlGaAs/GaAs multiple quantum well structure	Frost, F	American Institute of Physics	1980

1052	Measurement of the direct energy gap of coherently strained SnxGe1-x/Ge(001) heterostructures/	Ragan, Regina	American Institute of Physics	2000

1053	Measurement of the dynamic input impedance of a dc superconducting quantum interference device at audio frequencies	Falferi, P	American Institute of Physics	1980

1054	Measurement of the dynamo effect in a plasma	Ji, H	American Institute of Physics	1980

1055	Measurement of the effects of the localized field of a magnetic force microscope tip on a 180�domain wall	Foss, S	American Institute of Physics	1980

1056	Measurement of the exchange anisotropy in Co/CoO bilayers using the anisotropic magnetoresistance	Miller, B. H	American Institute of Physics	1980

1057	Measurement of the excited-state position of bound-to-bound quantum-well infrared detectors/	Zhou, L	American Institute of Physics	2001

1058	Measurement of the extent of strain relief in InGaAs layers grown under tensile strain on InP(100) substrates	Maigne, P	American Institute of Physics	1980

1059	Measurement of the full polarimetric transition matrix of a magnetized plasma	Segre, S. E	American Institute of Physics	1980

1060	Measurement of the hydrodynamic corrections to the Brownian motion of two colloidal spheres	Crocker, J. C	American Institute of Physics	1980

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