| 41 |
|
Quantitative analysis of piezoelectricity in simultaneously stretched and corona poled polyvinyl chloride films
|
Bharti, V
|
American Institute of Physics
|
1980
|
|
|
|
| 42 |
|
Quantitative analysis of radiation induced Si/SiO~2 interface defects bymeans of MeV He single ion irradiation
|
Koh, M
|
American Institute of Physics
|
1980
|
|
|
|
| 43 |
|
Quantitative analysis of the nitrogenation process in Y~2Fe~1~7N~x basedon a two-region configuration
|
Yang, D. P
|
American Institute of Physics
|
1980
|
|
|
|
| 44 |
|
Quantitative assessment of the effects of carrier screening on the average electric field in a GaAs-based p-i-n nanostructure under subpicosecondlaser excitation
|
Tsen, K. T
|
American Institute of Physics
|
1980
|
|
|
|
| 45 |
|
Quantitative calculation of spontaneous polarization in ferroelectric liquid crystals
|
Terzis, A. F
|
American Institute of Physics
|
1980
|
|
|
|
| 46 |
|
Quantitative characterization of additional ferromagnetic phase in melt-quenched and sintered Nd-Fe-B-based magnets
|
Lewis, L. H
|
American Institute of Physics
|
1980
|
|
|
|
| 47 |
|
Quantitative C lattice site distributions in epitaxial Ge1-yCy/Ge(001) layers/
|
D'Arcy-Gall, J
|
American Institute of Physics
|
2001
|
|
|
|
| 48 |
|
Quantitative comparisons of dissolved hydrogen density and the electrical and optical properties of ZnO/
|
Seager, C. H
|
American Institute of Physics
|
2003
|
|
|
|
| 49 |
|
Quantitative compositional analysis of InAs/GaAs quantum dots by scanning transmission electron microscopy/
|
Zhi, D
|
American Institute of Physics
|
2001
|
|
|
|
| 50 |
|
Quantitative correlation between the local coercivity variation and magnetization reversal dynamics in Co/Pd multilayer thin films/
|
Jang, H.-J
|
American Institute of Physics
|
2003
|
|
|
|
| 51 |
|
Quantitative evaluation of fabrication processes of proton-exchanged layers in LiTaO3 optoelectronic devices by the line-focus-beam ultrasonic material characterization system/
|
Kushibiki, J
|
American Institute of Physics
|
2001
|
|
|
|
| 52 |
|
Quantitative field measurements from magnetic force microscope tips and comparison with point and extended charge models/
|
Mcvitie, S
|
American Institute of Physics
|
2001
|
|
|
|
| 53 |
|
Quantitative imaging of magnetic domain walls in thin films using Lorentz and magnetic force microscopies/
|
Mcvitie, Stephen
|
American Institute of Physics
|
2001
|
|
|
|
| 54 |
|
Quantitative imaging of nanoscale mechanical properties using hybrid nanoindentation and force modulation/
|
Syed Asif, S A
|
American Institute of Physics
|
2001
|
|
|
|
| 55 |
|
Quantitative in situ x-ray diffraction analysis of magnetic multilayers during annealing
|
Chladek, M
|
American Institute of Physics
|
1980
|
|
|
|
| 56 |
|
Quantitative investigation of localized ion irradiation effects in n-channel metal-oxide-semiconductor field-effect transistors using single ion microprobe
|
Koh, M
|
American Institute of Physics
|
1980
|
|
|
|
| 57 |
|
Quantitative long-range-order measurement and disordering efficiency estimation in ion-irradiated bulk Ni3Al using cross-sectional conventional transmission electron microscopy/
|
de Almeida, P
|
American Institute of Physics
|
2000
|
|
|
|
| 58 |
|
Quantitative magnetic field measurements with the magnetic force microscope
|
Proksch, R
|
American Institute of Physics
|
1980
|
|
|
|
| 59 |
|
Quantitative magneto-optic field imaging of recording heads
|
Heidmann, J
|
American Institute of Physics
|
1980
|
|
|
|
| 60 |
|
Quantitative mobility spectrum analysis of multicarrier conduction in semiconductors
|
Meyer, J. R
|
American Institute of Physics
|
1980
|
|
|
|
기사
(271)
