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A Qualitative Account for Anisotropic Broadening in Whole-Powder-Diffraction-Pattern Fitting by Second-Rank Tensors
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Le Bail, A
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Munksgaard International Booksellers and Publishers
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1980
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| 2 |
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Quantitative Analysis of Time-Resolved Laue Diffraction Patterns
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Ren, Z
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Munksgaard International Booksellers and Publishers
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1980
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| 3 |
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Quantitative Determination of Low-Phase Volume Fraction in Ferro-SiliconAlloys by the Rietveld Profile-Refinement Method. Neutron Diffraction Data Compared with Other Methods
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Gueneau, C
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Munksgaard International Booksellers and Publishers
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1980
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| 4 |
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Quantitative Phase Analysis by X-ray Diffraction of Multiphased Binary Alloy Coatings: Application to Brass Coating
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Bolle, B
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Munksgaard International Booksellers and Publishers
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1980
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| 5 |
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Quantitative texture analysis by Rietveld refinement
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Von Dreele, R. B
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Munksgaard International Booksellers and Publishers
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1980
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| 6 |
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Quantitative Texture Analysis from X-ray Diffraction Spectra
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Wang, Y. D
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Munksgaard International Booksellers and Publishers
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1980
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| 7 |
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Quantitative � Phase Analysis in Al-Li Alloys using the Rietveld Method
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Perez-Landazabal, J. I
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Munksgaard International Booksellers and Publishers
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1980
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| 8 |
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The Quantification of Different Forms of Cristobalite in Devitrified Alumino-Silicate Ceramic Fibres
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Butler, M. A
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Munksgaard International Booksellers and Publishers
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1980
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