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A Raman microprobe study of electrical treeing in polyethylene/
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Vaughan, A. S
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Chapman and Hall
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2003
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| 2 |
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Radiation damage induced in Si photodiodes by high-temperature neutron irradiation/
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Matsuoka, H.; Claeys, C.; Takakura, K.; Uemura, J.; Ohyama, H. Jono, T.; Simoen, E.; Kishikawa, T.
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Chapman and Hall
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2003
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| 3 |
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Radiation enhanced modification of HDPE for medical applications/
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Suwanprateeb, J
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Chapman and Hall
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2003
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| 4 |
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Raman study of ion-implanted hydrogenated amorphous silicon
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Danesh, P
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Chapman and Hall
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2003
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| 5 |
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Rapid thermal annealing of Cu/WNx/Si structures/
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Lipsanen, A. Franssila, S. Kuivalainen, P.; Rauhala, E.; Seppala, A.;
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Chapman and Hall
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2003
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| 6 |
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Rate-dependent fracture toughness of pure polycrystalline ice/
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Xu, X
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Chapman and Hall
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2003
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| 7 |
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Reaction-induced phase separation in an epoxy/low molecular weight solvent system/
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Soule, E. Borrajo, J.; Oyanguren, P. A.; de la Mata, M. G.; Galante, M. J.
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Chapman and Hall
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2003
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| 8 |
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Reaction mechanism in the ball-milled Al-Ti-C powders/
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Liu, X.; Zhang, J.; Wang, Z. Bian, X.
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Chapman and Hall
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2003
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| 9 |
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Reactive brazing of ceria to an ODS ferritic stainless steel/
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Khan, T. I. Al-Badri, A.
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Chapman and Hall
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2003
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| 10 |
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Reactive hot pressing of Al2O3-Ni composites/
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Fahrenholtz, W. G.
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Chapman and Hall
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2003
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| 11 |
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Reactive processing of nickel-aluminide intermetallic compounds/
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Zhu, H. X. Abbaschian, R.
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Chapman and Hall
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2003
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| 12 |
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Realization of electroplating molds with thick positive SPR 220-7 photoresist/
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Kukharenka, E. Kraft, M.
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Chapman and Hall
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2003
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| 13 |
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Recombination echoes in disordered silicon
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Lips, K
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Chapman and Hall
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2003
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| 14 |
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Recrystallized grain size prediction in a particulate reinforced metal matrix composite/
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Munroe, P. R. Ferry, M.
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Chapman and Hall
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2003
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| 15 |
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Re-examination of the post-transit photocurrents in expanding-thermal-plasma-grown a-Si : H/
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Brinza, M
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Chapman and Hall
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2003
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| 16 |
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Reflection from natural fibres Determination of the scale angle profile/
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Butcher, E. C.; Vassis, P. Holt, L. A. Lee, A. R.;
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Chapman and Hall
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2003
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| 17 |
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Relation between the mother ingot microstructure and the glass forming ability of a bulk glass forming alloy/
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Zhou, Y. H. LI, J. F.; Song, J. L. Yan, Z. J.; He, S. R.;
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Chapman and Hall
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2003
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| 18 |
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Relationships between secondary dendrite arm spacing and mechanical properties of Zn-40Al-Cu alloys/
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Savaskan, T. Turhal, M. S.
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Chapman and Hall
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2003
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| 19 |
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Relaxor ferroelectric thin-film heterostructures: Scaling of dielectric properties/
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Tyunina, M. Leppavuori, S. Levoska, J.;
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Chapman and Hall
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2003
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| 20 |
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Relevance of roughness parameters for describing and modelling machined surfaces
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Bigerelle, M. Najjar, D.; Iost, A.
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Chapman and Hall
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2003
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