| 1 |
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Scanning tunneling microscopy study of the Er/Ge(111) c(2 X 8) interface/
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Pelletier, S
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Published for the Society by the American Institute of Physics
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2000
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| 2 |
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Search for improved transparent conducting oxides: A fundamental investigation of CdO, Cd2SnO4, and Zn2SnO4/
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Coutts, T J
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Published for the Society by the American Institute of Physics
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2000
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| 3 |
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Semi-empirical modeling of the optical gap of amorphous hydrogenated nitrogenated carbon films/
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Santo, Larissa L E
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Published for the Society by the American Institute of Physics
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2000
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| 4 |
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Sensitivity studies of silicon etching in chlorine/argon plasmas/
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Kleditzsch, S
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Published for the Society by the American Institute of Physics
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2000
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| 5 |
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Sequential turret source-masking system for fabrication of multilayer structures
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Anthopoulos, T
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Published for the Society by the American Institute of Physics
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2000
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| 6 |
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Si etching rate calculation for low pressure high density plasma source using Cl2 gas/
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Lee, Young D
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Published for the Society by the American Institute of Physics
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2000
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| 7 |
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Spectra mapping of scanning tunneling microscope-induced light from electrochemically deposited Ag films on Au/
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Nishitani, R
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Published for the Society by the American Institute of Physics
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2000
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| 8 |
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Structural and mechanical characterization of fluorinated amorphous-carbon films deposited by plasma decomposition of CF4-CH4 gas mixtures/
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Jacobsohn, L G
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Published for the Society by the American Institute of Physics
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2000
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| 9 |
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Studies on plasma-nitrided iron by scanning electron microscopy, glancing angle x-ray diffraction, and x-ray photoelectron spectroscopy/
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Miola, Eduardo J
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Published for the Society by the American Institute of Physics
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2000
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| 10 |
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Studies on the optimum condition for the formation of a neutral loop discharge plasma/
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Sung, Y M
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Published for the Society by the American Institute of Physics
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2000
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| 11 |
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Study of chemical vapor deposition diamond film evolution from a nanodiamond precursor by C13 isotopic labeling and ion implantation/
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Gouzman, I
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Published for the Society by the American Institute of Physics
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2000
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| 12 |
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Study of the double layer CeO2/Nb2O5 thin film/
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Zhang, Zaoli
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Published for the Society by the American Institute of Physics
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2000
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| 13 |
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Subject Index to Volume 18 ///
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Published for the Society by the American Institute of Physics
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2000
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| 14 |
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Surface loss coefficients of CFx and F radicals on stainless steel/
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Singh, Harmeet
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Published for the Society by the American Institute of Physics
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2000
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