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X-ray diffraction from single fibres of spider silk
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Bram, A
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Munksgaard International Booksellers and Publishers
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1980
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| 2 |
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X-ray Diffraction-Line Broadening Analysis: Paracrystalline Method
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Somashekar, R
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Munksgaard International Booksellers and Publishers
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1980
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| 3 |
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X-ray Moire Topography on SIMOX Structures
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Ohler, M
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Munksgaard International Booksellers and Publishers
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1980
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| 4 |
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X-ray Multiple Diffraction in Renninger Scanning Mode: Simulation of Data Recorded using Synchrotron Radiation
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Sasaki, J. M
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Munksgaard International Booksellers and Publishers
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1980
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| 5 |
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X-ray Multiple Diffraction Phenomenon in the Evaluation of SemiconductorCrystalline Perfection
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Morelhao, S. L
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Munksgaard International Booksellers and Publishers
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1980
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| 6 |
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X-ray Polytype Examination of SiC Bulk Crystals in Back-Reflection Geometry
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Dressler, L
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Munksgaard International Booksellers and Publishers
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1980
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| 7 |
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X-ray Rocking-Curve Analysis of Crystals with Buried Amorphous Layers. Case of Ion-Implanted Silicon
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Milita, S
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Munksgaard International Booksellers and Publishers
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1980
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| 8 |
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X-ray Scattering on Stacking Faults in 123 Crystals Considering Local Changes of Distances between Atomic Layers
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Rud, N. D
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Munksgaard International Booksellers and Publishers
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1980
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| 9 |
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X-ray Scattering Studies of Metalloproteins in Solution: a Quantitative Approach for Studying Molecular Conformations
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Guenter Grossmann, J
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Munksgaard International Booksellers and Publishers
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1980
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| 10 |
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X-ray Standing Waves in X-ray Specular Reflection and Fluorescence Studyof Nano-Films
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Zheludeva, S. I
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Munksgaard International Booksellers and Publishers
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1980
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| 11 |
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X-ray Triple-Crystal Diffractometry and Transmission Electron MicroscopyCharacterization of Defects in Lattice-Mismatched Epitaxic Structures
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Kyutt, R. N
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Munksgaard International Booksellers and Publishers
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1980
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| 12 |
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XRSV: a program for displaying structures on the PC-AT
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Weber, S
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Munksgaard International Booksellers and Publishers
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1980
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