충남대학교 외국학술지지원센터

제한항목: 1980

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자료유형
- 기사 (350)
저자
- Borkowski, K. J (3)
- ADLHART, W (2)
- Bellissent-Funel, M.-C (2)
- Buote, D. A (2)
- Chu, G (2)
- 더보기(20)
- more...더보기 취소
출판사
발행년도
- 1980 (350)

No	서명	저자	발행처	원문제공시작년
161	X-ray Crystal Structures of Cytochrome c Oxidases from Paracoccus denitrificans and Bovine Heart and Their Implications for the Molecular Mechanism of Cell Respiration	Kadenbach, B	VCH Verlagsgesellschaft mbH, [etc.]	1980

162	X-ray detection by superconducting tunnel junctions via phonon propagation in the substrate	Poelaert, A	American Institute of Physics	1980

163	X-ray detection of Supernova 1988Z with the ROSAT High Resolution Imager	Fabian, A. C	Priestley and Weale	1980

164	X-ray detection of the dwarf nova V101 in M5	Hakala, P. J	Priestley and Weale	1980

165	X-ray detection using a superconducting transition-edge sensor microcalorimeter with electrothermal feedback	Irwin, K. D	American Institute of Physics	1980

166	X-ray detectors for digital radiography	Yaffe, M. J	Institute of Physics in association with the American Institute of Physics and the American Associat	1980

167	X-ray diffraction analysis of InGaP/GaAs heterointerfaces grown by metalorganic chemical vapor deposition	Nittono, T	American Institute of Physics	1980

168	X-ray Diffraction Analysis of Scrapie Prion: Intermediate and Folded Structures in a Peptide Containing Two Putative �Helices	Inouye, H	Academic Press	1980

169	X-ray diffraction and EXAFS studies of silicate glasses containing Mg, Ca and Ba atoms	Taniguchi, T	North-Holland	1980

170	X-Ray diffraction and solid-state nuclear magnetic resonance study of a silicate containing two different nitrogenous cations	Harris, R. K	Royal Society of Chemistry	1980

171	X-ray diffraction and x-ray photoelectron spectroscopy study of partially strained SiGe layers produced via excimer laser processing	Martelli, S	American Institute of Physics	1980

172	X-ray Diffraction from Faulted Close-Packed Structures. Analytic Solution for Intensities /	LELE, SHRIKANT	Published for the International Union of Crystallography by Munksgaard	1980

173	X-ray Diffraction from Nonstoichiometric Titanium Sulfide Containing Stacking Faults/	ONODA, M	Published for the International Union of Crystallography by Munksgaard	1980

174	X-ray diffraction from single fibres of spider silk	Bram, A	Munksgaard International Booksellers and Publishers	1980

175	X-ray-diffraction investigation of the anodic oxidation of porous silicon	Buttard, D	American Institute of Physics	1980

176	X-ray Diffraction-Line Broadening Analysis: Paracrystalline Method	Somashekar, R	Munksgaard International Booksellers and Publishers	1980

177	X-ray diffraction measurements for expanded fluid selenium up to the metallic region	Inui, M	North-Holland	1980

178	X-Ray diffraction method에 의한 copper metal의 구조 고찰=	김문집	忠南大學校自然科學硏究所	1980

179	X-Ray Diffraction Pattern from Internal Structure of Bovine Rhodopsin	Kawaguchi, T	Japanese Biochemical Society	1980

180	X-ray diffraction pole figure measurements of diamond films grown on platinum (111)	Tachibana, T	American Institute of Physics	1980

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