1 |
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Xerographic and electroabsorption study of primary photocarrier generation process in x-form metal-free phthalocyanine/
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Umeda, Minoru
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American Institute of Physics
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2001
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2 |
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X-ray absorption fine structure and electron energy loss spectroscopy study of silicon nanowires at the SiL3,2 edge/
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Sun, X-H
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American Institute of Physics
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2001
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3 |
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X-ray absorption spectroscopy and magnetic circular dichroism of the Mn-ferrite nanocrystalline thin films/
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Stichauer, L
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American Institute of Physics
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2001
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4 |
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X-RAY AND OPTICAL SPECTRA OF THE UNUSUAL CATACLYSMIC VARIABLES LS PEGASI AND T LEONIS/
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Szkody, Paula
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American Institute of Physics
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2001
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5 |
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X-ray diffraction analysis of a selectively grown InGaAsP epitaxial layer/
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Nakashima, Kiichi
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American Institute of Physics
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2001
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6 |
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X-ray diffraction and Raman scattering study of SrBi2Ta2O9 ceramics and thin films with Bi3TiNbO9 addition/
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Zhu, J S
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American Institute of Physics
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2001
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7 |
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X-ray diffraction investigation of n-type porous silicon/
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Chamard, V
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American Institute of Physics
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2001
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8 |
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X-ray diffraction line broadening under elastic deformation of a polycrystalline sample: An elastic-anisotropy effect/
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Singh, Anil K
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American Institute of Physics
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2001
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9 |
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X-ray induced persistent photoconductivity in Si-doped Al0.35Ga0.65As/
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Soh, Yeong-Ah
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American Institute of Physics
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2001
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10 |
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X-ray magnetic circular dichroic magnetometry on Ni/Pt multilayers/
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Poulopoulos, P
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American Institute of Physics
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2001
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11 |
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X-ray photoelectron spectroscopic study of KrF excimer laser nitrided InP surface/
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Akane, Toshimitsu
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American Institute of Physics
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2001
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12 |
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X-ray photoelectron spectroscopy and micro-Raman analysis of conductive RuO2 thin films/
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Bhaskar, S
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American Institute of Physics
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2001
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13 |
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X-ray reflectivity of self-assembled structures in SiGe multilayers and comparison with atomic force microscopy/
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Meduna, M
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American Institute of Physics
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2001
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14 |
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X-ray study of antiphase boundaries in the quadruple-period ordered GaAs0.87Sb0.13 alloy/
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Zhong, Zhenyang
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American Institute of Physics
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2001
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