| 21 |
|
X-ray diffraction analysis of InGaP/GaAs heterointerfaces grown by metalorganic chemical vapor deposition
|
Nittono, T
|
American Institute of Physics
|
1980
|
|
|
|
| 22 |
|
X-ray diffraction analysis of the defect structure in epitaxial GaN/
|
Heinke, H
|
American Institute of Physics
|
2000
|
|
|
|
| 23 |
|
X-ray diffraction and ferromagnetic resonance study of sputtered (110) GaAs/Fe epitaxial films/
|
Ding, Y
|
American Institute of Physics
|
2003
|
|
|
|
| 24 |
|
X-ray diffraction and Mossbauer studies of structural changes and L1~0 ordering kinetics during annealing of polycrystalline Fe~5~1Pt~4~9 thin films/
|
Spada, F. E
|
American Institute of Physics
|
2003
|
|
|
|
| 25 |
|
X-ray diffraction and optical characterization of interdiffusion in self-assembled InAs/GaAs quantum-dot superlattices/
|
Xu, S J
|
American Institute of Physics
|
2000
|
|
|
|
| 26 |
|
X-ray diffraction and Raman scattering study of SrBi2Ta2O9 ceramics and thin films with Bi3TiNbO9 addition/
|
Zhu, J S
|
American Institute of Physics
|
2001
|
|
|
|
| 27 |
|
X-ray diffraction and x-ray photoelectron spectroscopy study of partially strained SiGe layers produced via excimer laser processing
|
Martelli, S
|
American Institute of Physics
|
1980
|
|
|
|
| 28 |
|
X-ray diffraction investigation of n-type porous silicon/
|
Chamard, V
|
American Institute of Physics
|
2001
|
|
|
|
| 29 |
|
X-ray-diffraction investigation of the anodic oxidation of porous silicon
|
Buttard, D
|
American Institute of Physics
|
1980
|
|
|
|
| 30 |
|
X-ray diffraction line broadening under elastic deformation of a polycrystalline sample: An elastic-anisotropy effect/
|
Singh, Anil K
|
American Institute of Physics
|
2001
|
|
|
|
| 31 |
|
X-ray diffraction pole figure measurements of diamond films grown on platinum (111)
|
Tachibana, T
|
American Institute of Physics
|
1980
|
|
|
|
| 32 |
|
X-ray diffraction study of alternating nanocrystalline silicon/amorphoussilicon multilayers
|
Wu, X. L
|
American Institute of Physics
|
1980
|
|
|
|
| 33 |
|
X-ray diffraction study of GaAs/InAs/GaAs ultrathin single quantum well
|
Bai, J
|
American Institute of Physics
|
1980
|
|
|
|
| 34 |
|
X-ray diffraction study of solid-state formation of metastable MoSi~2 and TiSi~2 during mechanical alloying
|
Yen, B. K
|
American Institute of Physics
|
1980
|
|
|
|
| 35 |
|
X-ray emission from plasmas created by smoothed KrF laser irradiation
|
Aglitskiy, Y
|
American Institute of Physics
|
1980
|
|
|
|
| 36 |
|
X-ray Fraunhofer diffraction patterns from a thin-film waveguide
|
Feng, Y. P
|
American Institute of Physics
|
1980
|
|
|
|
| 37 |
|
X-ray generation enhancement from a laser-produced plasma with a porous silicon target
|
Nishikawa, T
|
American Institute of Physics
|
1980
|
|
|
|
| 38 |
|
X-ray generation in cryogenic targets irradiated by 1 � pulse laser
|
Shimoura, A
|
American Institute of Physics
|
1980
|
|
|
|
| 39 |
|
X-ray induced modification of electronic properties of boron nitride thin films/
|
Ageev, V
|
American Institute of Physics
|
2000
|
|
|
|
| 40 |
|
X-ray induced persistent photoconductivity in Si-doped Al0.35Ga0.65As/
|
Soh, Yeong-Ah
|
American Institute of Physics
|
2001
|
|
|
|