| 641 |
|
X-ray Determination of Piezoelectric Constants/
|
BARSCH, GERHARD R
|
Published for the International Union of Crystallography by Munksgaard
|
1976
|
|
|
|
| 642 |
|
X-ray Determination of the Electron Distribution in Crystals of [Co(NH3)6][Cr(CN)6]at 80K/
|
IWATA, MIYUKI
|
Published for the International Union of Crystallography by Munksgaard
|
1977
|
|
|
|
| 643 |
|
X-ray Determination of the Lattice Parameter and the Thermal Expansion of Lead Nitrate/
|
BICHILE, G. K
|
Published for the International Union of Crystallography by Munksgaard
|
1975
|
|
|
|
| 644 |
|
X-ray Determination of the mean-Square Atomic Displacements and Associated Debye Temperature of Mg2Sn/
|
SKELTON, E. F
|
Published for the International Union of Crystallography by Munksgaard
|
1974
|
|
|
|
| 645 |
|
X-ray Determination of thermal Expansion of Olivines/
|
SINGH, H. P
|
Published for the International Union of Crystallography by Munksgaard
|
1976
|
|
|
|
| 646 |
|
X-ray determination of thermal expansion of zinc oxide /
|
KHAN, AIJAZ A
|
Published for the International Union of Crystallography by Munksgaard
|
1968
|
|
|
|
| 647 |
|
X-ray Dichroism and Polarized Anomalous Scattering of the Uranyl Ion /
|
Templeton, David H
|
Published for the International Union of Crystallography by Munksgaard
|
1982
|
|
|
|
| 648 |
|
X-ray diffraction analyses of titanium coatings produced by electron beam evaporation in neon and argon inert gases/
|
Avelar-Batista, J. C
|
Published for the Society by the American Institute of Physics
|
2003
|
|
|
|
| 649 |
|
X-ray diffraction analysis of a selectively grown InGaAsP epitaxial layer/
|
Nakashima, Kiichi
|
American Institute of Physics
|
2001
|
|
|
|
| 650 |
|
X-ray diffraction analysis of InGaP/GaAs heterointerfaces grown by metalorganic chemical vapor deposition
|
Nittono, T
|
American Institute of Physics
|
1980
|
|
|
|
| 651 |
|
X-ray Diffraction Analysis of Scrapie Prion: Intermediate and Folded Structures in a Peptide Containing Two Putative �Helices
|
Inouye, H
|
Academic Press
|
1980
|
|
|
|
| 652 |
|
X-ray diffraction analysis of the defect structure in epitaxial GaN/
|
Heinke, H
|
American Institute of Physics
|
2000
|
|
|
|
| 653 |
|
X-ray diffraction analysis of yttria stabilized zirconia powders produced by an organic sol-gel method/
|
Goldie, D M; Paton, J Callon, G J Dibb, M F; Cairns, J A;
|
Chapman and Hall
|
2000
|
|
|
|
| 654 |
|
X-ray diffraction and equation of state of hydrogen at megabar pressures
|
Loubeyre, P
|
Macmillan Journals ltd., etc.]
|
1996
|
|
|
|
| 655 |
|
X-ray diffraction and EXAFS studies of silicate glasses containing Mg, Ca and Ba atoms
|
Taniguchi, T
|
North-Holland
|
1980
|
|
|
|
| 656 |
|
X-ray diffraction and ferromagnetic resonance study of sputtered (110) GaAs/Fe epitaxial films/
|
Ding, Y
|
American Institute of Physics
|
2003
|
|
|
|
| 657 |
|
X-ray diffraction and magnetization studies on Sm~2Fe~1~7 and its nitrides
|
Shen, N. X
|
North-Holland Pub. Co
|
1996
|
|
|
|
| 658 |
|
X-ray diffraction and Moessbauer studies of the (Fe~1~-~xNi~x)~4N compounds (0 �x �0.5)
|
Li, F
|
North-Holland Pub. Co
|
1995
|
|
|
|
| 659 |
|
X-ray Diffraction and Molecular Modeling Studies of Poly(di-n-alkylsilanes): The Near Planar Type Phases of Poly(di-n-butylsilane) and Poly(di-n-hexylsilane)/
|
Winokur, M. J
|
American Chemical Society
|
2003
|
|
|
|
| 660 |
|
X-ray diffraction and Mossbauer studies of structural changes and L1~0 ordering kinetics during annealing of polycrystalline Fe~5~1Pt~4~9 thin films/
|
Spada, F. E
|
American Institute of Physics
|
2003
|
|
|
|
unknown
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