941 |
|
X-ray Raman scattering involving electronic continuum resonances
|
Gel'mukhanov, F
|
IOP Pub
|
1980
|
|
|
942 |
|
X-ray reciprocal space mapping of a (112) oriented HgTe/Hg~0~.~1Cd~0~.~9Te superlattice
|
Li, M
|
American Institute of Physics
|
1980
|
|
|
943 |
|
X-ray reciprocal-space mapping of strain relaxation and tilting in linearly graded InAlAs buffers
|
Olsen, J. A
|
American Institute of Physics
|
1980
|
|
|
944 |
|
X-ray reciprocal space mapping of strain relaxation in GaAs~1~-~xN~x on GaAs [100] by molecular-beam epitaxy/
|
Cheah, W. K
|
American Institute of Physics
|
2003
|
|
|
945 |
|
X-ray refinement of the structure of cubic telluric acid
|
FALCK, LENNART
|
Published for the International Union of Crystallography by Munksgaard
|
1978
|
|
|
946 |
|
X-ray Refinement of the Structure of [N,N'-(3-Aza-1,5-pentanediyl)bis(salicylideneiminato)]dioxouranium(Ⅵ)/
|
BENETOLLO, F
|
Published for the International Union of Crystallography by Munksgaard
|
1979
|
|
|
947 |
|
X-ray reflection anomalous fine structure analysis of the stability of permalloy/copper multilayers/
|
Luo, G M
|
North-Holland Pub. Co
|
2001
|
|
|
948 |
|
X-ray reflection anomalous fine structure analysis of the stability of permalloy/copper multilayers/
|
Luo, G M
|
North-Holland Pub. Co
|
2001
|
|
|
949 |
|
X-ray reflection in Galactic black hole candidates: smeared edge profiles and resonant Auger destruction
|
Ross, R. R
|
Priestley and Weale
|
1980
|
|
|
950 |
|
X-ray reflectivity: a new tool for the study of glass surfaces
|
Grimal, J. M
|
North-Holland
|
1980
|
|
|
951 |
|
X-ray reflectivity determination of interface roughness correlated with transport properties of (AlGa)As/GaAs high electron mobility transistor devices
|
Dura, J. A
|
American Institute of Physics
|
1980
|
|
|
952 |
|
X-ray reflectivity of self-assembled structures in SiGe multilayers and comparison with atomic force microscopy/
|
Meduna, M
|
American Institute of Physics
|
2001
|
|
|
953 |
|
X-ray reflectivity study of behenic acid Langmuir-Blodgett mono- and multilayers on SiO~2 surfaces as-deposited and after thermal treatment: Influence of substrate/film interactions on molecular ordering and film topology
|
Asmussen, A
|
American Institute of Physics
|
1980
|
|
|
954 |
|
X-ray, reflectivity study on gold films during sputter deposition
|
Chiarello, R. P
|
North-Holland Pub. Co
|
1980
|
|
|
955 |
|
X-ray refraction effects: application to the imaging of biological tissues/
|
Lewis, R. A
|
British Institute of Radiology
|
2003
|
|
|
956 |
|
X-ray refractive planar lens with minimized absorption/
|
Aristov, V
|
American Institute of Physics
|
2000
|
|
|
957 |
|
X-Ray Reprocessing by a Molecular Torus in the Seyfert 1.9 Galaxy NGC 2992
|
Weaver, K. A
|
Published by the University of Chicago Press for the American Astronomical Society
|
1980
|
|
|
958 |
|
X-ray resonant scattering studies of charge and orbital ordering in Pr1-xCaxMnO3
|
Zimmermann, M v
|
|
2001
|
|
|
959 |
|
X-ray resonant scattering studies of orbital and charge ordering in Pr1-xCaxMnO3 (17 pages)/
|
Zimmermann, M v
|
Published for the American Physical Society by the American Institute of Physics
|
2001
|
|
|
960 |
|
X-ray resonant scattering study of an intermediate-valence Ho-Ce alloy/
|
Goff, J P
|
North-Holland Pub. Co
|
2001
|
|
|