| 801 |
|
X-ray Holographic Interferometry in the Determination of Planar Multilayer Structures. Theory and Experimental Observations/
|
LESSLAUER, W
|
Published for the International Union of Crystallography by Munksgaard
|
1971
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|
|
|
| 802 |
|
X-ray holography with atomic resolution
|
Tegze, M
|
Macmillan Journals ltd., etc.]
|
1996
|
|
|
|
| 803 |
|
X-RAY IMAGES OF HOT ACCRETION FLOWS/
|
�zel, Feryal
|
|
2001
|
|
|
|
| 804 |
|
X-RAY IMAGES OF HOT ACCRETION FLOWS/
|
�zel, Feryal
|
|
2001
|
|
|
|
| 805 |
|
X-Ray Imaging and Spectroscopy of the Supernova Remnant CTB 109 and Its Associated Pulsar 1E 2259+586
|
Rho, J
|
Published by the University of Chicago Press for the American Astronomical Society
|
1980
|
|
|
|
| 806 |
|
X-ray Imaging of Stress and Strain of Diamond, Iron, and Tungsten at Megabar Pressures
|
Hemley, R. J
|
American Association for the Advancement of Science
|
1980
|
|
|
|
| 807 |
|
X-ray imaging-spectroscopy of Abell 1835/
|
Peterson, J R
|
Springer-Verlag
|
2001
|
|
|
|
| 808 |
|
X-ray-induced chemistry of interstellar clouds
|
Lepp, S
|
Springer-Verlag
|
1996
|
|
|
|
| 809 |
|
X-ray Induced Electron Emission Study of GaAs Near Surface Region composition Damage Caused by Ar+ Ion Bombardment /
|
Pogrebitsky, K.Ju
|
VSV Co. Ltd
|
1997
|
|
|
|
| 810 |
|
X-ray induced luminescence and spatial resolution of La~2O~2S:Tb phosphor screens
|
Kandarakis, I
|
Institute of Physics in association with the American Institute of Physics and the American Associat
|
1980
|
|
|
|
| 811 |
|
X-ray induced modification of electronic properties of boron nitride thin films/
|
Ageev, V
|
American Institute of Physics
|
2000
|
|
|
|
| 812 |
|
X-ray induced persistent photoconductivity in Si-doped Al0.35Ga0.65As/
|
Soh, Yeong-Ah
|
American Institute of Physics
|
2001
|
|
|
|
| 813 |
|
X-ray induced photoemission of a localized electron and its application to site-selective x-ray absorption fine structure measurement/
|
Ishii, Masashi
|
American Institute of Physics
|
2000
|
|
|
|
| 814 |
|
X-raying a galaxy: PHL 6625 behind NGC 247
|
Elvis, M
|
Priestley and Weale
|
1980
|
|
|
|
| 815 |
|
X-ray Inspection of Flip Chip Attach Using Digital Tomosynthesis
|
Rooks, S.
|
WELA PUBLICATIONS LTD
|
1995
|
|
|
|
| 816 |
|
X-ray Intensity Measurements on Large Crystals by energy-Dispersive Diffractometry:
|
FUKAMACHI, T
|
Published for the International Union of Crystallography by Munksgaard
|
1976
|
|
|
|
| 817 |
|
X-ray Intensity Measurements on Large Crystals by Energy-Dispersive Diffractometry.Ⅰ.Energy Dependences of Diffraction Intensities near the Absorption Edge/
|
FUKAMACHI, T
|
Published for the International Union of Crystallography by Munksgaard
|
1976
|
|
|
|
| 818 |
|
X-ray Intensity Measurements on Large Crystals by Energy-Dispersive Diffractometry. Ⅲ Fine Structures of Integrated Intensities and Anomalous Scattering Factors near the K Absorption Edges in GaAs /
|
FUKAMACHI, T
|
Published for the International Union of Crystallography by Munksgaard
|
1977
|
|
|
|
| 819 |
|
X-ray Intensity Measurements on Large Crystals by Energy-Dispersive Diffractometry.Ⅳ.Determination of Anomalous Scattering Factors near the Absorptiom Edges of GaAs by the One-Intensity-Ratio Method /
|
FUKAMACHI, T
|
Published for the International Union of Crystallography by Munksgaard
|
1979
|
|
|
|
| 820 |
|
X-ray Interferometry with Divergent Polychromatic Beams
|
SHULAKOV, E.V
|
Published for the International Union of Crystallography by Munksgaard
|
1979
|
|
|
|
unknown
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