충남대학교 외국학술지지원센터

글로벌메뉴

주메뉴

이용안내
원문검색
센터소개
- 소개
- 연혁
- 운영시간
- 조직
게시판
- 이용안내
- 원문검색
- 센터소개
  - 소개
  - 연혁
  - 운영시간
  - 조직
- 게시판

CNU Search

|Home >
원문검색>
CNU Search>
가나다리스트

탭메뉴

전체 ㅣ A B C D E F G H I J K L M N O P Q R S T U V W X Y Z ㅣ 가 나 다 라 마 바 사 아 자 차 카 타 파 하 기타

검색어[가나다ABC : ]

총 896건 중 896건 출력

40/45 페이지

제한항목: 1980; American Institute of Physics

검색간략리스트

검색리스트 테이블
No	서명	저자	발행처	원문제공시작년
781	Atomic bonding in amorphous carbon alloys: A thermodynamic approach	Efstathiadis, H	American Institute of Physics	1980

782	Atomic configurations of Er centers in GaAs:Er,O and AlGaAs:Er,O studiedby site-selective luminescence spectroscopy	Takahei, K	American Institute of Physics	1980

783	Atomic configurations of group V acceptors in ZnSe, ZnTe, and CdTe	Ostheimer, V	American Institute of Physics	1980

784	Atomic diffusion induced by stress relaxation in InGaAs/GaAs epitaxial layers	Roura, P	American Institute of Physics	1980

785	Atomic displacement processes in irradiated amorphous and crystalline silicon	Nordlund, K	American Institute of Physics	1980

786	Atomic force and scanning electron microscopic observations of surface and domain structures of BaTiO~3 films and bulk crystals	Tsunekawa, S	American Institute of Physics	1980

787	Atomic force and scanning tunneling microscopy study of current-voltage properties of TiB~2 microcontacts	Heuberger, M	American Institute of Physics	1980

788	Atomic force microscope study of photo-polymerized and photo-dimerized epitaxial C~6~0 films	Hassanien, A	American Institute of Physics	1980

789	Atomic force microscope tip-induced local oxidation of silicon: kinetics, mechanism, and nanofabrication	Avouris, P	American Institute of Physics	1980

790	Atomic force microscopy and photoluminescence study of Ge layers and self-organized Ge quantum dots on Si(100)	Palange, E	American Institute of Physics	1980

791	Atomic force microscopy for high speed imaging using cantilevers with anintegrated actuator and sensor	Manalis, S. R	American Institute of Physics	1980

792	Atomic force microscopy for the determination of refractive index profiles of optical fibers and waveguides: A quantitative study	Huntington, S. T	American Institute of Physics	1980

793	Atomic force microscopy growth modeling of SiC buffer layers on Si(100) and quality optimization	Ferro, G	American Institute of Physics	1980

794	"Atomic force microscopy imaging of viscoelastic properties in toughenedpolypropylene resins" [J. Appl. Phys. 78, 5956 (1995)]	Nysten, B	American Institute of Physics	1980

795	Atomic force microscopy of selenium sulfide passivated GaAs (100) surface	Kuruvilla, B. A	American Institute of Physics	1980

796	Atomic force microscopy study of self-organized Ge islands grown on Si(100) by low pressure chemical vapor deposition	Capellini, G	American Institute of Physics	1980

797	Atomic hydrogen cleaning of GaSb(001) surfaces	Bell, G. R	American Institute of Physics	1980

798	Atomic hydrogen enhanced reflow of copper	Miyake, T	American Institute of Physics	1980

799	Atomic layer controlled deposition of silicon nitride with self-limitingmechanism	Goto, H	American Institute of Physics	1980

800	Atomic layer controlled growth of SiO~2 films using binary reaction sequence chemistry	Klaus, J. W	American Institute of Physics	1980

31 32 33 34 35 36 37 38 39 40

임시보관함보기

글로벌메뉴

주메뉴

CNU Search

탭메뉴

검색간략리스트

하단메뉴