자료유형 | 연속간행물 |
---|---|
단체저자명 | IEEE Electron Devices Society. IEEE Reliability Group. IEEE Reliability Society. Institute of Electrical and Electronics Engineers. Electron Devices Group. |
서명/저자사항 | Reliability physics. |
권.연차 사항 | Began with vol. for 1970. |
권.연차 사항 | -31st (March 23-25, 1993). |
발행사항 | New York, N.Y.: Electron Devices and Reliability Societies of the Institute of Electrical and Electronics Engineers, [1970]-c1993. |
형태사항 | v.: ill.; 28 cm. |
딸림자료 | |
간행빈도 | Annual |
축약서명 | Reliab. phys. |
등록서명 | Reliability physics |
ISSN | 0735-0791 |
CODEN | ARLPBI |
일반주기 |
Description based on: 19th (Apr. 7-9, 1981).
|
서지주기 | Includes bibliographical references. |
색인/초록 수록지 | Chemical Abstracts 0009-2258 Index to IEEE publications 0099-1368 |
발행자(변경)주기 | Sponsored by: the IEEE Electron Devices Society and the IEEE Reliability Group, 1970- ; the IEEE Electron Devices Group and the IEEE Reliability Group, <1974-1978>; the IEEE Electron Devices Society and the IEEE Reliability Society, <1981>-1993. |
회의명 | International Reliability Physics Symposium. |
일반주제명 | Electronic apparatus and appliances -- Reliability -- Congresses. Electronic apparatus and appliances -- Testing -- Congresses. Integrated circuits -- Reliability -- Congresses. Integrated circuits -- Testing -- Congresses. |
언어 | 영어 |
후속저록 | IEEE international reliability physics proceedings , 1082-7285 , (DLC) 95647571 , (OCoLC)30847997 |
선행저록 | Reliability Physics Symposium. , Proceedings |
No. | 권호·제본정보 보기 | 소장처 | 소장사항 | 청구기호 | 구독 | 최근입수호 |
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1 | 중앙도서관/보존자료실(방문전대출신청필수)/ | 621.381 I61a 1970-1993 |