| 9301 |
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Atomic Displacement Relationship to Rhombohedral Deformation on some Perovskite-Type Compounds./
|
MOREAU, JEAN-MICHEL
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Published for the International Union of Crystallography by Munksgaard
|
1980
|
|
|
|
| 9302 |
|
Atomic Emission Lines in the Spectrum Observed After the Impact Between the L-Fragment of Comet D/Shoemaker-Levy 9 and Jupiter
|
Costa, R. D. D
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Published by the University of Chicago Press for the American Astronomical Society
|
1980
|
|
|
|
| 9303 |
|
Atomic exchange mean field study of intermixing of Au on Ag(110)
|
Nieminen, J. A
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North-Holland Pub. Co
|
1980
|
|
|
|
| 9304 |
|
Atomic force and electron microscopy of sporangial wall microfibrils in Linderina pennispora
|
McKeown, T. A
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Cambridge University Press
|
1980
|
|
|
|
| 9305 |
|
Atomic force and scanning electron microscopic observations of surface and domain structures of BaTiO~3 films and bulk crystals
|
Tsunekawa, S
|
American Institute of Physics
|
1980
|
|
|
|
| 9306 |
|
Atomic force and scanning tunneling microscopy study of current-voltage properties of TiB~2 microcontacts
|
Heuberger, M
|
American Institute of Physics
|
1980
|
|
|
|
| 9307 |
|
Atomic force microscope studies of membranes: force measurement and imaging in electrolyte solutions
|
Bowen, W. R
|
Elsevier Scientific Pub. Co
|
1980
|
|
|
|
| 9308 |
|
Atomic force microscope study of photo-polymerized and photo-dimerized epitaxial C~6~0 films
|
Hassanien, A
|
American Institute of Physics
|
1980
|
|
|
|
| 9309 |
|
Atomic force microscope tip-induced local oxidation of silicon: kinetics, mechanism, and nanofabrication
|
Avouris, P
|
American Institute of Physics
|
1980
|
|
|
|
| 9310 |
|
Atomic force microscopic demonstration of DNA looping by GaIR and HU
|
Lyubchenko, Y. L
|
Information Retrieval Limited
|
1980
|
|
|
|
| 9311 |
|
Atomic Force Microscopic Imaging and Velocity Measurement of Monoatomic Terrace Motion on the (111) Cu Surface during Electrodeposition
|
Wu, Q
|
Electrochemical Society
|
1980
|
|
|
|
| 9312 |
|
Atomic force microscopy and photoluminescence study of Ge layers and self-organized Ge quantum dots on Si(100)
|
Palange, E
|
American Institute of Physics
|
1980
|
|
|
|
| 9313 |
|
Atomic force microscopy and scanning tunneling microscopy studies on thegrowth mechanism of a-Si:H film on graphite substrate
|
Matsuse, M
|
North-Holland
|
1980
|
|
|
|
| 9314 |
|
Atomic force microscopy for high speed imaging using cantilevers with anintegrated actuator and sensor
|
Manalis, S. R
|
American Institute of Physics
|
1980
|
|
|
|
| 9315 |
|
Atomic force microscopy for the determination of refractive index profiles of optical fibers and waveguides: A quantitative study
|
Huntington, S. T
|
American Institute of Physics
|
1980
|
|
|
|
| 9316 |
|
Atomic force microscopy growth modeling of SiC buffer layers on Si(100) and quality optimization
|
Ferro, G
|
American Institute of Physics
|
1980
|
|
|
|
| 9317 |
|
"Atomic force microscopy imaging of viscoelastic properties in toughenedpolypropylene resins" [J. Appl. Phys. 78, 5956 (1995)]
|
Nysten, B
|
American Institute of Physics
|
1980
|
|
|
|
| 9318 |
|
Atomic Force Microscopy Observations of Si Surfaces after Rinsing in Ultrapure Water with Low Dissolved Oxygen Concentration
|
Usuda, K
|
Electrochemical Society
|
1980
|
|
|
|
| 9319 |
|
Atomic force microscopy of cotton fiber cell wall surfaces in air and water: quantitative and qualitative aspects
|
Pesacreta, T. C
|
Springer-Verlag
|
1980
|
|
|
|
| 9320 |
|
Atomic force microscopy of heavy metal fluoride glasses
|
Anselm, L
|
North-Holland
|
1980
|
|
|
|